Every reference with a DOI in the deposited reference list resolved to a known
work in Crossref or DataCite at the dated check, and none carried a retraction,
withdrawal, or removal notice.
The 45 checked references that resolve
resolves10.1038/nchem.1589The chemistry of two-dimensional layered transition metal dichalcogenide nanosheets
resolves10.1002/jrs.5234<scp>SERS</scp> analysis of selectively captured exosomes using an integrin‐specific peptide ligand
resolves10.1002/jrs.5200Resonance Raman effects in transition metal dichalcogenides
resolves10.1039/C399200013861T-MoS
<sub>2</sub>
, a new metallic modification of molybdenum disulfide
resolves10.1023/A:1018538424373Synthesis and characterization of molybdenum disulphide formed from ammonium tetrathiomolybdate
resolves10.1021/nl4007479Intrinsic Structural Defects in Monolayer Molybdenum Disulfide
resolves10.1103/PhysRevLett.105.136805Atomically Thin
<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline">
<mml:msub>
<mml:mi>MoS</mml:mi>
<mml:mn>2</mml:mn>
</mml:msub>
</mml:math>
: A New Direct-Gap Semiconductor
resolves10.1021/nl403036hTunable Photoluminescence of Monolayer MoS<sub>2</sub> via Chemical Doping
resolves10.1021/nl401544yExtraordinary Sunlight Absorption and One Nanometer Thick Photovoltaics Using Two-Dimensional Monolayer Materials
resolves10.1021/nn500532fStrong Photoluminescence Enhancement of MoS<sub>2</sub> through Defect Engineering and Oxygen Bonding
resolves10.1103/PhysRevB.91.195411Effect of disorder on Raman scattering of single-layer<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:mi>Mo</mml:mi><mml:msub><mml:mi mathvariant="normal">S</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math>
resolves10.1038/srep02657Defects activated photoluminescence in two-dimensional semiconductors: interplay between bound, charged and free excitons
resolves10.1002/smll.201301542Layer Thinning and Etching of Mechanically Exfoliated MoS<sub>2</sub> Nanosheets by Thermal Annealing in Air
resolves10.1002/jrs.4416Enhancement of lattice defect signatures in graphene and ultrathin graphite using tip‐enhanced Raman spectroscopy
resolves10.1002/jrs.4998Hydrothermal reduction of graphene oxide; effect on surface‐enhanced Raman scattering
resolves10.1021/nl0808684Graphene Oxidation: Thickness-Dependent Etching and Strong Chemical Doping
resolves10.1021/nl1029607Atmospheric Oxygen Binding and Hole Doping in Deformed Graphene on a SiO<sub>2</sub> Substrate
resolves10.1021/nl300901aProbing the Nature of Defects in Graphene by Raman Spectroscopy
resolves10.1021/acsnano.6b00895Photochemical Reaction in Monolayer MoS<sub>2</sub> <i>via</i> Correlated Photoluminescence, Raman Spectroscopy, and Atomic Force Microscopy
resolves10.1002/jrs.5196Enhanced Raman and photoluminescence response in monolayer MoS<sub>2</sub> due to laser healing of defects
resolves10.1039/C8RA01849AHomogeneity and tolerance to heat of monolayer MoS
<sub>2</sub>
on SiO
<sub>2</sub>
and h-BN
resolves10.1039/c3nr03220eSuppression of thermally activated carrier transport in atomically thin MoS2 on crystalline hexagonal boron nitride substrates
resolves10.1021/nn1003937Anomalous Lattice Vibrations of Single- and Few-Layer MoS<sub>2</sub>
resolves10.1007/s12274-014-0424-0The effect of the substrate on the Raman and photoluminescence emission of single-layer MoS2
resolves10.1103/PhysRevB.89.125406Photoluminescence of freestanding single- and few-layer<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mtext>MoS</mml:mtext><mml:mn>2</mml:mn></mml:msub></mml:math>
resolves10.1103/PhysRevB.84.155413Phonons in single-layer and few-layer MoS<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msub><mml:mrow/><mml:mn>2</mml:mn></mml:msub></mml:math>and WS<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msub><mml:mrow/><mml:mn>2</mml:mn></mml:msub></mml:math>
resolves10.1103/PhysRevMaterials.1.024002Atomic-layered
<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mi>MoS</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:math>
on
<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mi>SiO</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:math>
under high pressure: Bimodal adhesion and biaxial strain effects
resolves10.1063/1.4914968Charge trapping at the MoS2-SiO2 interface and its effects on the characteristics of MoS2 metal-oxide-semiconductor field effect transistors
resolves10.1021/nn202852jNature of Electronic States in Atomically Thin MoS<sub>2</sub> Field-Effect Transistors
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