Reference health
Electron‐ and X‐ray‐induced electron emissions from insulators
29/29 checkable references clean · checked 2026-08-19
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
11 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 29 checked references that resolve
resolves10.1063/1.329789
The characterization of x-ray photocathodes in the 0.1–10-keV photon energy region
resolves10.1063/1.1149887
Space charge measurement in a dielectric material after irradiation with a 30 kV electron beam: Application to single-crystals oxide trapping properties
resolves10.1063/1.112611
Stable secondary electron emission observations from chemical vapor deposited diamond
resolves10.1016/S0038-1101(98)00219-6
Electronic properties of diamond for high-power device applications
resolves10.1016/S0169-4332(98)00819-8
Measurements of secondary electron-emission coefficients and cathodoluminescence spectra for annealed alumina ceramics
resolves10.1063/1.323938
0.1–10-keV x-ray-induced electron emissions from solids—Models and secondary electron measurements
resolves10.1103/PhysRevB.19.3004
Soft-x-ray-induced secondary-electron emission from semiconductors and insulators: Models and measurements
resolves10.1063/1.371601
An improved model for ultraviolet- and x-ray-induced electron emission from CsI
resolves10.1016/S0921-5107(99)00359-1
Electron beam induced optical and electronical properties of SiO 2
resolves10.1063/1.1662156
Effects of secondary electron scattering on secondary emission yield curves
resolves10.1111/j.1365-2818.1987.tb02817.x
A model for calculating secondary and backscattered electron yields
resolves10.1016/S0168-583X(98)00290-0
Escape probability of low energy electrons and positrons emitted in random directions beneath a plane solid surface
resolves10.1002/(SICI)1096-9918(19980501)26:5<343::AID-SIA377>3.0.CO;2-M
Degradation of poly(vinyl alcohol) thin films during monochromatized XPS: substrate effects and x-ray intensity dependence
resolves10.1002/sia.740211002
X‐ray photoelectron spectroscopic study of ion etching and electrical biasing of silicon nitride on a carbon fiber
resolves10.1002/(SICI)1096-9918(199706)25:6<390::AID-SIA247>3.0.CO;2-X
Charging Phenomena and Charge Compensation in AES on Metal Oxides and Silica
resolves10.1046/j.1365-2818.1997.2550812.x
A physical approach to the radiation damage mechanisms induced by X‐rays in X‐ray microscopy and related techniques
The 11 references without a DOI — listed, not checked
no DOI — not checkedPhysics and Applications of Secondary Electron Emission
no DOI — not checkedHonchnaya Electronnaya Emissia
no DOI — not checkedSolid State Physics
no DOI — not checkede_1_2_7_9_2
no DOI — not checkedSaitoY MichizonoS SatoT KobayashiSandJardinC Proc 3rd Internet Conf on Electric Charge in Solid Insulators Tours France June 1998 ed by Damamme G Le Vide SFV Paris382(1998).
no DOI — not checkede_1_2_7_24_2
no DOI — not checkede_1_2_7_27_2
no DOI — not checkedAdvances in Electronics and Electron Physics
no DOI — not checkedProc XII EUREM
no DOI — not checkedProc MSA–MAS Annual Meeting Microscopy and Microanalysis6:752(2000).
no DOI — not checkedProc ICEM 13, Paris 1994
What this badge says. CiteStamped means the CHECKABLE references of this
work were clean at the dated check: each resolved to a known work in a public registry, and none
carried a retraction notice at that time. It says nothing about the quality, findings,
or importance of the work itself, and nothing about references deposited without a DOI.
checked 2026-08-19 — re-checked daily as this page is visited; titles and statuses come from Crossref and DataCite and are not part of the signed record
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