Reference health
Dielectric breakdown processes in anodic Ta2O5 and related oxides
77/77 checkable references clean · checked 2026-09-03
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
18 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 77 checked references that resolve
resolves10.1016/0040-6090(79)90469-3
High voltage thin film transistors manufactured with photolithography and with Ta2O5 as the gate oxide
resolves10.1109/T-ED.1984.21657
InP MISFET's with Al<sub>2</sub>O<sub>3</sub>/Native Oxide double-layer gate insulators
resolves10.1016/0013-4686(65)87018-9
A radiotracer study of the composition and properties of anodic oxide films on tantalum and niobium
resolves10.1016/0040-6090(75)90190-X
Multilayer structure of tantalum anodic oxide films formed in dilute phosphoric acid
resolves10.1016/0040-6090(88)90501-9
X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry study of anion incorporation in anodically grown films
resolves10.1007/BF01132407
Dielectric and structural characteristics of Ta2O5 anodic films formed in phosphoric acid electrolytes
resolves10.1016/0013-4686(75)90064-X
The effect of phosphorus incorporation on the dielectric constant and ionic conductivity of anodic tantalum oxide
resolves10.1149/1.2407379
Ellipsometric Studies of Anodic Oxide Films Formed on Tantalum in Dilute Phosphoric Acid
resolves10.1149/1.2425942
The Determination of the Density of Ta, Nb, and Anodically Formed Ta[sub 2]O[sub 5] and Nb[sub 2]O[sub 5]
resolves10.1016/0040-6090(83)90489-3
Comparison of spectrophotometric and ellipsometric methods of measuring the thickness of anodic oxide films on tantalum
resolves10.1088/0022-3727/7/15/313
Electrical conduction in reactively sputtered tantalum oxide thin films
resolves10.1139/p59-066
THE IMPEDANCE, RECTIFICATION, AND ELECTROLUMINESCENCE OF ANODIC OXIDE FILMS ON ALUMINUM
resolves10.1016/S0022-0728(78)80359-3
Interfacial control of the electronic current through the barrier-type anodic films in contact with an electrolyte
resolves10.1016/S0022-0728(79)80121-7
Electronic currents in anodic polarization of oxide-covered valve metals
resolves10.1149/1.2113964
Influence of Electrolyte Concentration on the Anodization and Breakdown Characteristics of Ta2 O 5 Films
resolves10.1016/0013-4686(78)85074-9
Galvanoluminescence of aluminium during anodization in non-dissolving electrolytes
resolves10.1016/0013-4686(80)90003-1
Localized nature of the luminescence during galvanostatic anodizing of high purity aluminium in inorganic electrolytes
resolves10.1016/0013-4686(75)85015-8
Problems and contradictions in galvanoluminescence, a critical review
resolves10.1016/0013-4686(79)87034-6
Electrical breaking down of barrier anodic films during their formation
resolves10.1016/0013-4686(77)80042-X
Theory of electrical breakdown during formation of barrier anodic films
resolves10.1016/0013-4686(71)85169-1
Experimental evaluation of some electrolytic breakdown hypotheses
resolves10.4139/sfj1950.35.475
Influence of anion on the breakdown voltage of barrier-type anodic oxide film on aluminum.
resolves10.1016/0013-4686(71)85130-7
Temperature increase during formation of anodic films on tantalum
resolves10.1149/1.2407292
Side Reactions during the Anodization of Aluminum in a Glycol Borate Electrolyte
resolves10.1016/0013-4686(70)80064-0
Electrolytic breakdown crystallization of anodic oxide films on A1, Ta and Ti
resolves10.1149/1.2115439
Breakdown Phenomena During the Growth of Anodic Oxide Films on Zirconium Metal: Influence of Experimental Parameters on Electrical and Mechanical Breakdown
resolves10.1016/S0010-938X(71)80125-7
Sparking voltages and side reactions during anodization of valve metals in terms of electron tunnelling
resolves10.1016/0022-0728(88)85154-4
Electrical and mechanical breakdown of anodic films on tungsten in aqueous electrolytes
resolves10.1016/0013-4686(77)85011-1
Luminescence, breakdown and colouring of anodic oxide films on aluminium
resolves10.1016/0013-4686(82)80010-8
The generation of flaws in anodic barrier-type films on aluminium
resolves10.1016/0040-6090(82)90005-0
The electrical breakdown during anodizing of high purity aluminium in borate solutions
resolves10.1016/S0022-0728(79)80011-X
A test of the anodic electron current on oxide-covered valve metals
resolves10.1016/0040-6090(87)90327-0
Formation of relatively pure alumina films by anodic polarization
The 18 references without a DOI — listed, not checked
no DOI — not checkedL. Young, in “Anodic Oxides Films” (Academic Press, New York, 1961).
no DOI — not checkedL. Young, in “Physics of Thin Film”, Vol. 6, edited by M. H. Francembs (Academic Press, New York, 1971).
no DOI — not checkedV. P. Molinenko, L. L. Odynets, S. S. Cherma-sova andE. Y. Khanina,Soviet Electrochem.,7 (1971) 1782.
no DOI — not checkedW. C. Van Geel, C. A. Pistorius andB. C. Bonma,Philips. Res. Rep.,12 (1957) 465.
no DOI — not checkedD. A. Vermilyea, in “Advances in Electrochemistry and Electrochemical Engineering”, edited by P. Delahay and C. W. Tobias, Vol. 3 (Interscience, New York, 1963) p. 211.
no DOI — not checkedJ. Yahalom, in Proceedings of Symposium on “Oxide-Electrolytes Interfaces”, edited by R. S. Alwitt (The Electrochem. Soc. Inc., New Jersey, 1973).
no DOI — not checkedR. Stratton, in “Progress in Dielectrics”, Vol. 3 (Heywood, London, 1961).
no DOI — not checkedN. Klein, in “Advances in Electronics and Electron Physics”, Vol. 26 (Academic Press, New York, 1969).
no DOI — not checkedJ. K. Nelson, in “Engineering Dielectrics”, Vol. 24, edited by R. Bartnikas and R. H. Eichorm, ASTM (1983).
no DOI — not checkedA. Von Hippel,Ergbn. Axakt. Naturw.,14 (1953) 79.
no DOI — not checkedH. Fröhlich,Proc. Roy. Soc.,A160 (1937) 230.
no DOI — not checkedIdem, IEEE Trans. Electr. Inst.,19 (1984) 1.
no DOI — not checkedS. Whitehead, in “Dielectric Breakdown of Solids” (Clarendon, Oxford, 1953).
no DOI — not checkedD. R. Volters andJ. J. Van Der Shoot,Philips J. Res.,40 (1985) 137 and 164.
no DOI — not checkedR. D. Wolters,Philips Tech. Rev.,43 (1987) 330.
no DOI — not checkedR. H. Lorents andA. B. Michael,Electrochem. Technol.,2 (1964) 160.
no DOI — not checkedM. Kato,J. Met. Finish. Soc. Japan,39 (1988) 1.
no DOI — not checkedV. P. Parkhutik andV. I. Shershulskii,Corrosion Sci., to be published (1991).
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