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The influence of grain-boundary segregation of Y in Cr2O3 on the oxidation of Cr metal
20/20 checkable references clean · checked 2026-07-23
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
11 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 20 checked references that resolve
resolves10.1016/0010-938X(80)90076-1
The influence of yttrium implantation on the oxidation behaviour of 67Ni33Cr, Fe43Ni27Cr and Fe41Ni25Cr10Al refractory alloys
resolves10.1016/0025-5416(85)90335-0
Improvement by cerium and yttrium ion implantation of the oxidation behaviour of a 20Cr25Ni Niobium-stabilized stainless steel in CO2
resolves10.1149/1.2095647
The Influence of Implanted Yttrium on the Microstructures of Chromia Scales Formed on a Co‐45 Weight Percent Cr Alloy
resolves10.1007/BF00656349
The influence of ion-implanted yttrium on the selective oxidation of chromium in Co-25 wt.% Cr
resolves10.1149/1.2100264
Segregation of Y to Grain Boundaries in Cr2 O 3 and NiO Scales Formed on an ODS Alloy
resolves10.1149/1.2100376
Segregation of Y to Grain Boundaries in the Al2 O 3 Scale Formed on an ODS Alloy
resolves10.1007/BF00665015
The influence of grain-boundary segregation of Y in Cr2O3 on the oxidation of Cr metal. II. Effects of temperature and dopant concentration
resolves10.1111/j.1151-2916.1986.tb07371.x
Observation of Coherent Perovskite Particles in Growing Chromia Films
resolves10.1149/1.2100775
The Influence of Implanted Yttrium on the Mechanism of Growth of Cr2 O 3 on Cr
resolves10.1116/1.572506
Summary Abstract: Oxygen transport in growing oxide films on chromium as studied by 18O/SIMS
resolves10.1103/RevModPhys.57.437
Transport processes during the growth of oxide films at elevated temperature
resolves10.1149/1.2129481
On High Temperature Oxidation of Chromium: II . Properties of and the Oxidation Mechanism of Chromium
resolves10.1111/j.1151-2916.1987.tb04910.x
Cation Tracer Diffusion in Cr
<sub>2</sub>
O
<sub>3</sub>
and Cr
<sub>2</sub>
<sub>O</sub>
3‐0.09 wt% Y
<sub>2</sub>
O
<sub>3</sub>
resolves10.1002/bbpc.19850890409
Investigations on the Growth Mechanisms of α‐Cr<sub>2</sub>O<sub>3</sub> on Ni‐Base Alloys with and without Y<sub>2</sub>O<sub>3</sub> Dispersions
The 11 references without a DOI — listed, not checked
no DOI — not checkedM. J. Bennett, J. E. Antill, R. F. A. Carney, G. Dearnaley, F. H. Fern, P. D. Goode, B. L. Myatt, J. F. Turner, and T. Warburton,Corrosion Sd. II 16, 729 (1976).
no DOI — not checkedM. J. Bennett, J. A. Desport, M. R. Houlton, P. A. Labun, and J. M. Titmarsh,Mater. Sci. Tech (1990, in press).
no DOI — not checkedD. P. Moon and M. J. Bennett,Materials Science Forum (1990, in press).
no DOI — not checkedC. M. Cotell, K. Przybylski, and G. J. Yurek, inFundamental Aspects of High Temperature Corrosion, Vol. II, D. Shores and G. J. Yurek, eds. (The Electrochemical Society, Proceedings Vol. 86?9, 1986).
no DOI — not checkedA. J. Garratt-Reed, inProceedings of the 44th Annual Meeting of the Electrochemical Society of America, G. W. Bailey, ed. (San Francisco Press, San Francisco, 1986), 702.
no DOI — not checkedA. J. Garratt-Reed and W. Furdanowicz (private communication, 1988).
no DOI — not checkedG. J. Yurek, inCorrosion Mechanisms, Florian Mansfield, ed. (Marcel Dekker, New York, 1987), p. 438.
no DOI — not checkedM. H. LaBranche, Ph.D. dissertation (MIT, Cambridge, 1985).
no DOI — not checkedT. S. Kassner, L. C. Walters, and R. E. Grace, inProceedings of the Symposium on Thermodynamics with Emphasis on Nuclear Materials and Atomic Transport in Solids (IAEA, Vienna, 1966).
no DOI — not checkedA. Atkinson and R. I. Taylor, inTransport in Non-Stoichiometric Compounds, G. Simkovich and V. S. Stubican, eds. (NATO ASI Series B, Vol.129, Plenum Press, New York, 1985).
no DOI — not checkedC. M. Cotell, Ph.D. thesis (Department of Materials Science and Engineering, Massachusetts Institute of Technology, 1988).
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