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Oxygen distribution in silicon nitride powders

https://doi.org/10.1007/bf01161483
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13/13 checkable references clean · checked 2026-07-22

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

4 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 13 checked references that resolve
resolves10.1002/jctb.5010180301
Formation and reactivity of nitrides I. Review and introduction
resolves10.1111/j.1151-2916.1973.tb12440.x
Synthesis, Characterization, and Consolidation of Si <sub>3</sub> N <sub>4</sub> Obtained from Ammonolysis of SiCl <sub>4</sub>
resolves10.1007/BF00541410
Synthesis of the ? form of silicon nitride from silica
resolves10.1016/0390-5519(76)90022-3
Thermodynamic analysis of the high-temperature stability of silicon nitride and silicon carbide
resolves10.1149/1.2132877
Surface Oxidation of Silicon Nitride Films
resolves10.1111/j.1151-2916.1975.tb19564.x
Structural Approach to the Problem of Oxygen Content in Alpha Silicon Nitride
resolves10.1146/annurev.ms.11.080181.002121
Silicon Nitride Ceramics: Composition, Fabrication Parameters, and Properties
resolves10.1016/0272-8842(84)90017-8
Formation of silicon oxinitride from Si3N4 and SiO2 in the presence of Al2O3
resolves10.1007/BF00550647
The effect of silicon purity on the strength of reaction-bonded Si3N4
resolves10.1016/0039-6028(84)90778-7
Characterization of oxidized platinum surfaces by X-ray photoelectron spectroscopy
resolves10.1116/1.571870
Auger and photoelectron line energy relationships in aluminum–oxygen and silicon–oxygen compounds
resolves10.1111/j.1151-2916.1986.tb04738.x
Compositionally Dependent Si 2 <i>p</i> Binding Energy Shifts in Silicon Oxynitride Thin Films
resolves10.1016/0022-3093(83)90466-0
XPS study of glassy grain boundary layers in dense, high-strength silicon nitride
The 4 references without a DOI — listed, not checked
no DOI — not checkedM. N. Rahaman, Y. Boiteux andL. C. Dejonghe,Ceram. Bull. 65 (1986) 1171.
no DOI — not checkedS. Wild, P. Grievenson andK. H. Jack,Spec. Ceram. 5 (1972) 385.
no DOI — not checkedH. Feld, P. Ettmayer andI. Petzenhauser,Ber. Dt. Keram. Ges. 51 (1974) 127.
no DOI — not checkedG. E. Muilenberg (ed.), ?Handbook of X-Ray Photoelectron Spectroscopy? (Perkin Elmer, Physical Electronics Division, Eden Prairie, Minnesota, 1979).
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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