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Orientation dependence of fracture toughness measured by indentation methods and its relation to surface energy in single crystal silicon

https://doi.org/10.1007/s10704-006-0021-7
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13/13 checkable references clean · checked 2026-07-23

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

8 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 13 checked references that resolve
resolves10.1111/j.1151-2916.1990.tb05119.x
Direct Observation and Analysis of Indentation Cracking in Glasses and Ceramics
resolves10.1016/S0921-5093(99)00077-5
Fracture anisotropy in silicon single crystal
resolves10.1016/0042-207X(96)00003-6
Silicon micromachining for integrated microsystems
resolves10.1063/1.1735524
Direct Measurements of the Surface Energies of Crystals
resolves10.1098/rsta.1921.0006
VI. The phenomena of rupture and flow in solids
resolves10.2472/jsms.40.405
Fracture toughness of single crystal silicon.
resolves10.4028/www.scientific.net/MSF.475-479.4043
HVEM Study of Crack Tip Dislocations in Silicon Crystals
resolves10.2320/jinstmet.68.86
Evaluation of Crystal Orientation Dependence of Surface Energy in Silicon
resolves10.1098/rspa.1989.0001
The brittle–ductile transition in silicon. I. Experiments
resolves10.2320/matertrans.44.681
Fracture Toughness Evaluated by Indentation Methods and Its Relation to Surface Energy in Silicon Single Crystals
resolves10.1103/PhysRevB.39.5566
Modeling solid-state chemistry: Interatomic potentials for multicomponent systems
resolves10.1149/1.1837021
Upper Yield Stress of Si Crystals at High Temperatures
The 8 references without a DOI — listed, not checked
no DOI — not checked21_CR1
no DOI — not checkedMechanical Behaviour of Ceramics
no DOI — not checkedGilman J.J. (1920). Fracture, The Technology Press of Massachusetts Institute of Technology. (1959) pp. 202.
no DOI — not checkedTheory of Dislocations
no DOI — not checkedStrong Solids
no DOI — not checked21_CR14
no DOI — not checked21_CR16
no DOI — not checked21_CR21
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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