Reference health
Computer simulation of strain energy effects vs surface and interface energy effects on grain growth in thin films
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30/30 checkable references clean · checked 2026-07-22
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
8 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 30 checked references that resolve
resolves10.1016/0036-9748(85)90206-6
Simulation of grain-growth in the presence of second phase particles
resolves10.1016/0036-9748(85)90157-7
Computer simulation of grain growth in a bidimensional polycrystal
resolves10.1016/0001-6160(84)90152-4
Computer simulation of grain growth—II. Grain size distribution, topology, and local dynamics
resolves10.1016/0001-6160(87)90258-6
The effect of nucleation conditions on the topology and geometry of two-dimensional grain structures
resolves10.1016/S0036-9748(88)80307-7
A two-dimensional computer simulation of capillarity-driven grain growth: Preliminary results
resolves10.1016/0956-7151(90)90114-V
Simulation of thin film grain structures—I. Grain growth stagnation
resolves10.1016/0956-7151(92)90020-F
Simulation of thin film grain structures—II. Abnormal grain growth
resolves10.1063/1.345756
The effects of dopants on surface-energy-driven secondary grain growth in silicon films
resolves10.1016/0956-716X(92)90513-E
Effects of grain orientation on hillock formation and grain growth in aluminum films on silicon substrates
resolves10.1557/JMR.1992.2040
Separation of film thickness and grain boundary strengthening effects in Al thin films on Si
resolves10.1557/JMR.1994.2411
Competition between strain and interface energy during epitaxial grain growth in Ag films on Ni(001)
resolves10.1016/0001-6160(89)90129-6
Energy and structure of (001) twist interphase boundaries in the Ag/Ni system
resolves10.1016/0001-6160(89)90188-0
Investigation of low energy interphase boundaries in agni by computer simulation and crystallite rotation
resolves10.1016/0040-6090(77)90346-7
Thermal strain in lead thin films I: Dependence of the strain on crystal orientation
The 8 references without a DOI — listed, not checked
no DOI — not checked10.1016/1359-6454(95)00365-7_BIB7
no DOI — not checkedS. Seel, R. Carel and C. V. Thompson, to be published in Polycrystaline Thin Films II—Structure Texture, Properties and Applications (edited by H. J. Frost, C. A. Ross, M. A. Parker and E. A. Holm), MRS Symposium Proceedings.
no DOI — not checked10.1016/1359-6454(95)00365-7_BIB29
no DOI — not checked10.1016/1359-6454(95)00365-7_BIB31
no DOI — not checkedThe Relation Between the Structure and Mechanical Properties of Metals
no DOI — not checked10.1016/1359-6454(95)00365-7_BIB36
no DOI — not checked10.1016/1359-6454(95)00365-7_BIB37
no DOI — not checked10.1016/1359-6454(95)00365-7_BIB38
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