Every reference with a DOI in the deposited reference list resolved to a known
work in Crossref or DataCite at the dated check, and none carried a retraction,
withdrawal, or removal notice.
The 39 checked references that resolve
resolves10.1088/0960-1317/15/4/015The coupling effect of interfacial adhesion and tensile residual stress on a thin membrane adhered to a flat punch
resolves10.1006/jcis.1999.6561Analysis of Contact Interactions between a Rough Deformable Colloid and a Smooth Substrate
resolves10.1021/la981034bInteraction and Adhesion of Vesicles: Coupling between Attractive Interactions and Bilayer Membrane Flexibility
resolves10.1016/S0039-6028(00)00474-XStudy on single-bond interaction between amino-terminated organosilane self-assembled monolayers by atomic force microscopy
resolves10.1016/j.eurpolymj.2004.01.014In situ estimation of the chemical and mechanical contributions in local adhesion force measurement with AFM: the specific case of polymers
resolves10.1098/rsta.1929.0009IX. The stress produced in a semi-infinite solid by pressure on part of the boundary
resolves10.1016/0021-9797(80)90419-1On the influence of molecular forces on the deformation of an elastic sphere and its sticking to a rigid plane
resolves10.1103/PhysRevB.55.10776Atomic-force-microscope study of contact area and friction on<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">NbSe</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>
resolves10.1016/S0021-9797(03)00049-3A generalized analytical model for the elastic deformation of an adhesive contact between a sphere and a flat surface
resolves10.1006/jcis.2000.6808General Equations Describing Elastic Indentation Depth and Normal Contact Stiffness versus Load
resolves10.1063/1.1150021Calibration of rectangular atomic force microscope cantilevers
resolves10.1063/1.2885090Indentation depth dependence of the mechanical strength of Ni films
resolves10.1021/la702513rEffect of Contact Geometry on the Pull-Off Force Evaluated under High-Vacuum and Humid Atmospheric Conditions
resolves10.1016/j.polymer.2005.11.095Quantifying the effects of contact duration, loading rate, and approach velocity on P-selectin–PSGL-1 interactions using AFM
resolves10.1063/1.2768919Influence of random roughness on the adhesion between metal surfaces due to capillary condensation
resolves10.1021/la052760zOn the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study
resolves10.1080/00218460600775773Force Curve Measurements with the AFM: Application to the In Situ Determination of Grafted Silicon-Wafer Surface Energies
The 6 references without a DOI — listed, not checked
no DOI — not checkedC.F. Carlson, J.Y. Jackson Heights, US Patent 2,297,691 (1939).
no DOI — not checked10.1016/j.apsusc.2010.06.031_bib7
no DOI — not checkedH. Hertz, Gezammelte werke, Leipzig, 1895 (in German).
no DOI — not checked10.1016/j.apsusc.2010.06.031_bib29
no DOI — not checked10.1016/j.apsusc.2010.06.031_bib36
no DOI — not checked10.1016/j.apsusc.2010.06.031_bib38
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