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Selective photo-thermal modulation of ZnO/Pt interface for monolithic 3D integration of oxide-based resistive random access memory

https://doi.org/10.1016/j.apsusc.2020.146380
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Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

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The 25 checked references that resolve
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Influence of carrier concentration on the resistive switching characteristics of a ZnO-based memristor
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The effect of oxygen vacancy on switching mechanism of ZnO resistive switching memory
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Stability scheme of ZnO-thin film resistive switching memory: influence of defects by controllable oxygen pressure ratio
resolves10.1021/acs.langmuir.6b01014
ZnO/Al:ZnO Transparent Resistive Switching Devices Grown by Atomic Layer Deposition for Memristor Applications
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Improvement of the performance in Cr-doped ZnO memory devices <i>via</i> control of oxygen defects
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High On–Off Ratio Improvement of ZnO-Based Forming-Free Memristor by Surface Hydrogen Annealing
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Multilevel resistance in ZnO nanowire memristors enabled by hydrogen annealing treatment
resolves10.1007/s12274-016-1267-7
Effect of carrier screening on ZnO-based resistive switching memory devices
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Dielectric Degradation of Cu/ SiO2/Si Structure during Thermal Annealing
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Modification of Properties of Yttria Stabilized Zirconia Epitaxial Thin Films by Excimer Laser Annealing
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Ultrafast switching in wetting properties of TiO2/YSZ/Si(001) epitaxial heterostructures induced by laser irradiation
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Resistive switching behavior in single crystal SrTiO3 annealed by laser
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Magnetoresistance Versus Oxygen Deficiency in Epi-stabilized SrRu1 − x Fe x O3 − δ Thin Films
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Blue luminescent centers and microstructural evaluation by XPS and Raman in ZnO thin films annealed in vacuum, N2 and O2
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The 2 references without a DOI — listed, not checked
no DOI — not checkedZinc oxide thin films for memristive devices: a review, Critical Reviews in Solid State and Materials
no DOI — not checkedThe effect of thermal annealing processes on structural and photoluminescence of zinc oxide thin film
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