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The affinity of Si–N and Si–C bonding in amorphous silicon carbon nitride (a-SiCN) thin film

https://doi.org/10.1016/j.diamond.2004.10.045
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11/11 checkable references clean · checked 2026-07-23

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

1 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 11 checked references that resolve
resolves10.1016/S0257-8972(98)00733-6
Hardness and stiffness of amorphous SiCxNy chemical vapor deposited coatings
resolves10.1002/anie.199706031
The First Crystalline Solids in the Ternary Si‐C‐N System
resolves10.1063/1.1386619
Thermal diffusivity in amorphous silicon carbon nitride thin films by the traveling wave technique
resolves10.1063/1.121383
Crystalline silicon carbon nitride: A wide band gap semiconductor
resolves10.1016/S0925-9635(01)00421-6
Bonding characterization and nano-indentation study of the amorphous SiC N films with and without hydrogen incorporation
resolves10.1103/PhysRevB.32.7988
Calculation of bulk moduli of diamond and zinc-blende solids
resolves10.1126/science.245.4920.841
Prediction of New Low Compressibility Solids
resolves10.1016/S0040-6090(99)00490-3
Crystalline SiCN: a hard material rivals to cubic BN
resolves10.1103/PhysRevB.58.9018
Electronic and atomic structures of the Si-C-N thin film by x-ray-absorption spectroscopy and theoretical calculations
resolves10.1103/PhysRevB.64.165305
Structure and elastic properties of amorphous silicon carbon nitride films
resolves10.1016/j.diamond.2003.11.084
Structural and electronic properties of wide band gap silicon carbon nitride materials—a first-principles study
The 1 reference without a DOI — listed, not checked
no DOI — not checked10.1016/j.diamond.2004.10.045_bib9
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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