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Effect of film thickness on microstructure parameters and optical constants of CdTe thin films
34/34 checkable references clean · checked 2026-07-23
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
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The 34 checked references that resolve
resolves10.1002/pssa.2211150126
Structural and electronic properties of evaporated thin films of cadmium telluride
resolves10.1063/1.335585
Lattice parameters of Zn1−<i>x</i>Mn<i>x</i>Se and tetrahedral bond lengths in AII1−<i>x</i>Mn<i>x</i>BVI alloys
resolves10.1016/0022-0248(90)90707-R
Crystal growth of large-area single-crystal CdTe and CdZnTe by the computer-controlled vertical modified-Bridgman process
resolves10.1016/S0927-0248(02)00351-3
The effects of inclusion of iodine in CdTe thin films on material properties and solar cell performance
resolves10.1088/0268-1242/17/12/306
New ways of developing glass/conducting glass/CdS/CdTe/metal thin-film solar cells based on a new model
resolves10.1016/j.solmat.2003.08.011
Investigation of non-aqueous electrodeposited CdS/Cd1−xZnxTe heterojunction solar cells
resolves10.1016/j.jallcom.2007.02.028
Structural, magnetic and optical properties of Co-diffused CdTe thin films
resolves10.1016/S0927-0248(02)00165-4
Electrical and optical properties of CdTe films prepared by vacuum evaporation with close spacing between source and substrate
resolves10.1002/(SICI)1521-396X(199807)168:1<177::AID-PSSA177>3.0.CO;2-9
Charge Transport Mechanisms in Au–CdTe Space-Charge-Limited Schottky Diodes
resolves10.1016/j.jallcom.2007.05.015
Room temperature electrocrystallization of CdSe thin films from ethylene glycol bath
resolves10.1016/S0927-0248(02)00276-3
Photo-induced current transient spectroscopic study of the traps in CdTe
resolves10.1016/j.solmat.2004.01.017
Characterization of CdTe thin film—dependence of structural and optical properties on temperature and thickness
resolves10.1016/j.solmat.2005.04.006
Influence of CdCl2 treatment on structural and optical properties of vacuum evaporated CdTe thin films
resolves10.1016/j.jallcom.2007.11.016
Influence of minor oxidation of the precursor powders to form nanocrystalline CdTe by mechanical alloying
resolves10.1016/j.solmat.2004.01.025
Spectroscopic ellipsometry investigation of optical and interface properties of CdTe films deposited on metal foils
resolves10.1016/0921-5093(92)90411-S
The mechanical behaviour of some titanium trialuminide intermetallics prepared using mechanical milling techniques
resolves10.1016/0965-9773(95)00088-7
Stacking faults and crystallite size in mechanically alloyed Cu-Co
resolves10.1103/PhysRevLett.28.355
Bonding Bands, Lone-Pair Bands, and Impurity States in Chalcogenide Semiconductors
resolves10.1088/0022-3735/16/12/023
Determination of the thickness and optical constants of amorphous silicon
resolves10.1016/0040-6090(94)06267-O
Optical characterization of wedge-shaped thin films of amorphous arsenic trisulphide based only on their shrunk transmission spectra
resolves10.1016/S0169-4332(03)00299-X
On the structural and optical characteristics of CdSe thin films
resolves10.1016/0040-6090(96)80030-7
Linear distribution of intensity of radiation reflected from and transmitted through a thin film on a thick substrate
resolves10.1080/14786437008221061
Conduction in non-crystalline systems V. Conductivity, optical absorption and photoconductivity in amorphous semiconductors
resolves10.1016/j.tsf.2006.10.012
Compositional dependence of the optical properties of amorphous antimony selenide thin films using transmission measurements
resolves10.1103/PhysRevB.51.13789
Interpretation of near-band-edge photoreflectance spectra from CdTe
resolves10.1016/j.jnoncrysol.2007.06.087
Optical properties of amorphous (As0.33S0.67)100−Te (x= 0, 1, 5 and 10) chalcogenide thin films, photodoped step-by-step with silver
resolves10.1080/14786430801968595
Calculation of optical constant of amorphous germanium arsenoselenide wedge-shaped thin films from their shrunk transmittance and reflectance spectra
The 5 references without a DOI — listed, not checked
no DOI — not checked10.1016/j.jallcom.2009.04.033_bib2
no DOI — not checked10.1016/j.jallcom.2009.04.033_bib20
no DOI — not checked10.1016/j.jallcom.2009.04.033_bib27
no DOI — not checked10.1016/j.jallcom.2009.04.033_bib32
no DOI — not checked10.1016/j.jallcom.2009.04.033_bib40
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