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The effect of annealing temperature on flexural strength, dielectric loss and thermal conductivity of Si3N4 ceramics

https://doi.org/10.1016/j.jallcom.2019.152203
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26/26 checkable references clean · checked 2026-07-22

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

2 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 26 checked references that resolve
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Phase relationships in the system Si<sub>3</sub>N<sub>4</sub>–SiO<sub>2</sub>–Yb<sub>2</sub>O<sub>3</sub>
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The 2 references without a DOI — listed, not checked
no DOI — not checkedEffect of intergranular phases on the high-frequency dielectric losses of silicon nitride ceramics
no DOI — not checkedSilicon nitride ceramics with high thermal conductivity and excellent mechanical properties fabricated with MgF2 sintering aid and post-sintering heat treatment
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