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Fractal description of dendrite growth during electrochemical migration

https://doi.org/10.1016/j.microrel.2008.06.010
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1/1 checkable references clean · checked 2026-07-23

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

13 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 1 checked reference that resolves
resolves10.1109/ISSE.2006.365387
Effects of Flux Residues on Surface Insulation Resistance and Electrochemical Migration
The 13 references without a DOI — listed, not checked
no DOI — not checkedHarsányi G. Failures of microcircuits’ innterconnections caused by electrochemical migration, DSc dissertation, Hungarian Academy of Sciences, Budapest; 2000.
no DOI — not checkedVicsek T. Fractal geometry, dinamical scaling and pattern-formation in growth processes, DSc dissertation, Hungarian Academy of Sciences, Budapest; 1988.
no DOI — not checkedEN-60068-2 (IEC 68-2). Environmental test methods.
no DOI — not checkedDominkovics Cs, Harsányi G. Qualitative and quantitative analysis of lead-free solder coated printed circuit board’s reliability especially considering the electrochemical migration. In: Proceedings of 11th international symposium for design and technology of electronic packaging, September 22–25, Cluj-Napoca, Romania; 2005. p. 80–4.
no DOI — not checkedDominkovics Cs, Harsányi G, Németh P. Qualitative analysis in the printed wiring board’s manufacturing and the applied fractal theory. In: Proceedings of 12th international symposium for design and technology of electronic packaging, September 21–24, Iasi, Romania; 2006. p. 117–21.
no DOI — not checkedIPC-TM-650. Section 2.5 electrical test methods and section 2.6 environmental test methods.
no DOI — not checkedIPC-TM-650. Test methods manual, section 2.6 environmental test methods, 2.6.14.1 electrochemical migration resistance test, electrochemical migration test group.
no DOI — not checkedMáté L. Self-affinity and fractal dimensions, manuscript, Budapest; 1994. p. 27–8.
no DOI — not checkedKasprzak W. Measurements, dimensions, invariant models and fractals, SPOLOM, Wroclaw; 2004.
no DOI — not checked<http://www.math.bme.hu/~mate>.
no DOI — not checkedSchuszter M. Analysis of electronmicroscopic images using fractal theory, PhD dissertation, Budapest University of Technology and Economics; 2000.
no DOI — not checked10.1016/j.microrel.2008.06.010_bib13
no DOI — not checkedMáté L. Fractals, chaos and discrete dinamical systems, part 2: fractal dimensions, manuscript, Budapest; 2000. p. 2.
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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