Reference health

Precision friction measurement between ultrathin wire and microprobe

https://doi.org/10.1016/j.sna.2011.05.020
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18/18 checkable references clean · checked 2026-07-22

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

2 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 18 checked references that resolve
resolves10.1088/0957-4484/15/11/033
Scale dependence of micro/nano-friction and adhesion of MEMS/NEMS materials, coatings and lubricants
resolves10.1016/S0038-1098(98)00244-0
On nanotribological interactions: Hard and soft interfacial junctions
resolves10.1063/1.2382265
On the importance of boundary conditions on nanomechanical bending behavior and elastic modulus determination of silver nanowires
resolves10.1038/nmat1403
Mechanical properties of ultrahigh-strength gold nanowires
resolves10.1063/1.2431712
Sliding of zinc oxide nanowires on silicon substrate
resolves10.1007/s11671-009-9478-4
Friction and Shear Strength at the Nanowire–Substrate Interfaces
resolves10.1016/j.sna.2004.06.030
Interfaces friction effect of sliding contact on nanoindentation test
resolves10.1023/A:1010017130136
Mechanics and Friction at the Nanometer Scale
resolves10.1002/smll.200800794
Friction Measurements of InAs Nanowires on Silicon Nitride by AFM Manipulation
resolves10.1103/PhysRevB.82.035403
Bias-controlled friction of InAs nanowires on a silicon nitride layer studied by atomic force microscopy
resolves10.1103/PhysRevLett.83.3328
Adhesion and Friction Forces between Spherical Micrometer-Sized Particles
resolves10.1109/TMECH.2004.828654
Atomic Force Microscope Probe Based Controlled Pushing for Nanotribological Characterization
resolves10.1002/(SICI)1521-4095(199902)11:2<161::AID-ADMA161>3.0.CO;2-J
Elastic Modulus of Ordered and Disordered Multiwalled Carbon Nanotubes
resolves10.1002/adma.200304549
Shear and Young's Moduli of MoS<sub>2</sub> Nanotube Ropes
resolves10.1103/PhysRevLett.85.1690
Elastic Modulus of Polypyrrole Nanotubes
resolves10.1007/s00339-010-6050-0
Small-span bending test for determination of elastic-plastic properties of ultrathin Pt wires
resolves10.2472/jsms.58.847
Evaluation of Mechanical and Electrical Properties of Very-Thin Pt Wires by Utilizing Joining Technique with Joule Heating
resolves10.1299/jmmp.4.545
An Integrated Compact Unit for Wide Range Micro-Newton Force Measurement
The 2 references without a DOI — listed, not checked
no DOI — not checkedMicro/nanotribology and materials characterization studies using scanning probe microscopy
no DOI — not checkedHigh sensitive microforce measurement by a range variable sensor
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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