Every reference with a DOI in the deposited reference list resolved to a known
work in Crossref or DataCite at the dated check, and none carried a retraction,
withdrawal, or removal notice.
The 36 checked references that resolve
resolves10.1016/j.tsf.2007.05.084Carrier transport in polycrystalline transparent conductive oxides: A comparative study of zinc oxide and indium oxide
resolves10.1016/j.solmat.2013.03.024Hydrogen-doped indium oxide/indium tin oxide bilayers for high-efficiency silicon heterojunction solar cells
resolves10.1063/1.3592885Micromorph thin-film silicon solar cells with transparent high-mobility hydrogenated indium oxide front electrodes
resolves10.1143/JJAP.46.L685Hydrogen-doped In<sub>2</sub>O<sub>3</sub> as High-mobility Transparent Conductive Oxide
resolves10.1016/j.solmat.2008.09.047High-mobility hydrogen-doped In2O3In2O3 transparent conductive oxide for a-Si:H/c-Si heterojunction solar cells
resolves10.1002/pssr.201409426High mobility In<sub>2</sub>O<sub>3</sub>:H transparent conductive oxides prepared by atomic layer deposition and solid phase crystallization
resolves10.1143/APEX.1.041501Reduction of Optical Loss in Hydrogenated Amorphous Silicon/Crystalline Silicon Heterojunction Solar Cells by High-Mobility Hydrogen-Doped In<sub>2</sub>O<sub>3</sub>Transparent Conductive Oxide
resolves10.1063/1.492874722.5% efficient silicon heterojunction solar cell with molybdenum oxide hole collector
resolves10.1016/j.tsf.2009.08.060Application of hydrogen-doped In2O3 transparent conductive oxide to thin-film microcrystalline Si solar cells
resolves10.1063/1.4921445Hydrogenated indium oxide window layers for high-efficiency Cu(In,Ga)Se2 solar cells
resolves10.1002/pip.2655Potential gain in photocurrent generation for Cu(In,Ga)Se<sub>2</sub> solar cells by using In<sub>2</sub>O<sub>3</sub> as a transparent conductive oxide layer
resolves10.1038/ncomms9932Low-temperature-processed efficient semi-transparent planar perovskite solar cells for bifacial and tandem applications
resolves10.1063/1.4936328Enhanced absorption in tandem solar cells by applying hydrogenated In2O3 as electrode
resolves10.1063/1.4764529Damage at hydrogenated amorphous/crystalline silicon interfaces by indium tin oxide overlayer sputtering
resolves10.1088/0268-1242/29/12/122001Influence of transparent conductive oxides on passivation of a-Si:H/c-Si heterojunctions as studied by atomic layer deposited Al-doped ZnO
resolves10.1021/cm103637tIndium Oxide Atomic Layer Deposition Facilitated by the Synergy between Oxygen and Water
resolves10.1021/acsami.5b04420Electron Scattering and Doping Mechanisms in Solid-Phase-Crystallized In<sub>2</sub>O<sub>3</sub>:H Prepared by Atomic Layer Deposition
resolves10.1063/1.3382344A consistent and accurate<i>ab initio</i>parametrization of density functional dispersion correction (DFT-D) for the 94 elements H-Pu
resolves10.1063/1.2832630An experimental study of charge distribution in crystalline and amorphous Si nanoclusters in thin silica films
resolves10.1103/PhysRevB.38.6084Microscopic structure of the<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">SiO</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>/Si interface
resolves10.1063/1.94565Probing the transition layer at the SiO2-Si interface using core level photoemission
resolves10.1063/1.4941298<i>In situ</i> photoluminescence study of plasma-induced damage at the <i>a</i>-Si:H/c-Si interface
resolves10.1063/1.2913320Staebler–Wronski-like formation of defects at the amorphous-silicon–crystalline silicon interface during illumination
resolves10.1103/PhysRevB.83.233301Very fast light-induced degradation of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi>a</mml:mi></mml:mrow></mml:math>-Si:H/<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi>c</mml:mi></mml:mrow></mml:math>-Si(100) interfaces
resolves10.1063/1.3601485Effect of ion bombardment on the a-Si:H based surface passivation of c-Si surfaces
resolves10.1149/1.3552663Ion and Photon Surface Interaction during Remote Plasma ALD of Metal Oxides
resolves10.1063/1.2432297Abruptness of a-Si:H∕c-Si interface revealed by carrier lifetime measurements
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