Reference health
Modification of the GaAs native oxide surface layer into the layer of the Ga2O3 dielectric by an Ar+ ion beam
18/18 checkable references clean · checked 2026-07-23
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
5 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 18 checked references that resolve
resolves10.1143/JJAP.24.L563
X-Ray Photoelectron Spectroscopy Study of GaAs (001) and InP (001) Cleaning Procedures Prior to Molecular Beam Epitaxy
resolves10.1103/PhysRevB.49.11159
Oxides on GaAs and InAs surfaces: An x-ray-photoelectron-spectroscopy study of reference compounds and thin oxide layers
resolves10.1016/S0169-4332(01)00583-9
An X-ray photoelectron spectroscopy study of the oxides of GaAs
resolves10.1016/j.mser.2003.12.002
Synthesis and properties of epitaxial electronic oxide thin-film materials
resolves10.1016/S0168-9002(03)00624-7
Commissioning results and performance of the high-resolution Russian–German Beamline at BESSY II
resolves10.1016/j.apsusc.2010.12.155
Formation of GaAs1−N nanofilm on GaAs by low energy N2+ implantation
resolves10.1002/sia.740171305
Calculations of electron inelastic mean free paths. III. Data for 15 inorganic compounds over the 50–2000 eV range
resolves10.1002/pssc.200982583
Chemical composition of GaAs‐nitride nanolayers formed by implantation
resolves10.1134/S1027451012080137
Formation of GaAsN/GaN cluster nanostructures on the surface of GaAs by the implantation of low-energy nitrogen ions
resolves10.1016/0092-640X(85)90016-6
Atomic subshell photoionization cross sections and asymmetry parameters: 1 ⩽ Z ⩽ 103
resolves10.1063/1.4879800
High-voltage field effect transistors with wide-bandgap <i>β</i>-Ga2O3 nanomembranes
The 5 references without a DOI — listed, not checked
no DOI — not checked10.1016/j.surfcoat.2018.03.004_bb0005
no DOI — not checkedCharacterization study of native oxides on GaAs (100) surface by XPS
no DOI — not checkedDepth profile analysis of native oxide layer on GaAs (100) surface
no DOI — not checked10.1016/j.surfcoat.2018.03.004_bb0080
no DOI — not checked10.1016/j.surfcoat.2018.03.004_bb0100
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