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Method for lateral force calibration in atomic force microscope using MEMS microforce sensor
29/29 checkable references clean · checked 2026-07-22
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
The 29 checked references that resolve
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Atomic force microscopy combined with optical tweezers (AFM/OT)
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Nano‐mechanical characterization of disassembling amyloid fibrils using the <scp>P</scp>eak <scp>F</scp>orce <scp>QNM</scp> method
resolves10.1088/0957-4484/25/21/215701
Elastic modulus and fracture strength evaluation on the nanoscale by scanning force microscope experiments
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Force measurements with the atomic force microscope: Technique, interpretation and applications
resolves10.1007/s11661-014-2437-4
Depth Dependence of Nanoindentation Pile-Up Patterns in Copper Single Crystals
resolves10.1016/j.ultramic.2003.10.005
Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs
resolves10.1016/j.ultramic.2013.03.009
Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration
resolves10.1007/s00339-016-0508-7
Effects of UV laser micropatterning on frictional performance of diamond-like nanocomposite films
resolves10.1166/jnn.2016.13535
Wear Characteristics of Fluorocarbon Thin Films Deposited Using Inductively Coupled and Capacitively Coupled Plasma Methods
resolves10.1007/s11249-015-0603-5
Influence of Alkali Ions on Tribological Properties of Silicon Surface
resolves10.1016/j.carbon.2016.06.073
Wear properties of graphene edges probed by atomic force microscopy based lateral manipulation
resolves10.1016/j.apsusc.2016.04.097
Static and kinetic friction characteristics of nanowire on different substrates
resolves10.1016/0043-1648(95)06784-1
Calibration procedures for frictional measurements with a lateral force microscope
resolves10.1016/j.ultramic.2015.10.028
Quantitative assessment of contact and non-contact lateral force calibration methods for atomic force microscopy
resolves10.1063/1.4904866
Precise and direct method for the measurement of the torsion spring constant of the atomic force microscopy cantilevers
resolves10.1063/1.3685243
Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope
resolves10.1063/1.4804163
The extended wedge method: Atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes
resolves10.1088/0022-3727/43/6/063001
Force calibration in lateral force microscopy: a review of the experimental methods
resolves10.1016/j.ultramic.2013.10.012
AFM lateral force calibration for an integrated probe using a calibration grating
resolves10.1063/1.1584082
An improved wedge calibration method for lateral force in atomic force microscopy
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