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Sulphur corrosion effect on the electrical performance of silver films elaborated by physical vapor deposition
18/18 checkable references clean · checked 2026-07-23
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
3 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 18 checked references that resolve
resolves10.1108/00035599910263152
Corrosion effects on the electrical performance of silver metal contacts
resolves10.1179/174327808X286275
Atmospheric corrosion of electro-electronics metals in urban desert simulated indoor environment
resolves10.1016/j.vacuum.2018.03.032
A study on corrosion resistance of Al magnetron sputtering coated AZ31 magnesium alloy
resolves10.1016/S0042-207X(99)00189-X
Magnetron sputtering: a review of recent developments and applications
resolves10.1016/j.surfcoat.2017.05.075
Structural, mechanical and corrosion resistance properties of Ti/TiN bilayers deposited by magnetron sputtering on AISI 316L
resolves10.1039/C6RA17869C
Structural properties and corrosion resistance of tantalum nitride coatings produced by reactive DC magnetron sputtering
resolves10.1016/j.vacuum.2012.01.016
Corrosion behaviour of CrN/Cr multilayers on stainless steel deposited by unbalanced magnetron sputtering
resolves10.1116/1.4959555
Low electrical resistivity in thin and ultrathin copper layers grown by high power impulse magnetron sputtering
resolves10.1039/C5CP02499D
An in situ high-temperature scanning electron microscopy study of acanthite–argentite phase transformation in nanocrystalline silver sulfide powder
resolves10.1016/j.apsusc.2018.02.090
Evaluation of atomic layer deposited alumina as a protective layer for domestic silver articles: Anti-corrosion test in artificial sweat
resolves10.1166/jnn.2016.10796
Tuning the Stoichiometry of Ag<SUB>2</SUB>S Thin Films for Resistive Switching Applications
The 3 references without a DOI — listed, not checked
no DOI — not checkedD. patent EP1788110 A1.
no DOI — not checkedC. Hillman, J. Arnold, S. Binfield, J. Seppi, DfR Solutions, College Park, MD, USA.
no DOI — not checked10.1016/j.vacuum.2019.01.024_bib20
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