Every reference with a DOI in the deposited reference list resolved to a known
work in Crossref or DataCite at the dated check, and none carried a retraction,
withdrawal, or removal notice.
The 26 checked references that resolve
resolves10.1149/1.1838366X‐Ray Photoelectron Spectroscopy and Scanning Tunneling Microscopy Study of Passive Films Formed on (100) Fe‐18Cr‐13Ni Single‐Crystal Surfaces
resolves10.1016/0010-938X(89)90029-2Remarks on the electronic structure of the oxide film on passive iron and the consequences for its electrode behaviour
resolves10.1149/1.2048689Artificial Cr‐ and Fe‐Oxide Passive Layers Prepared by Sputter Deposition
resolves10.1149/1.2086952Photocurrent Spectroscopic Investigations of Passive Films on Chromium
resolves10.1149/1.2100850p‐Type and n‐Type Behavior of Chromium Oxide as a Function of the Applied Potential
resolves10.1149/1.2059338Chemical Composition of Passive Films on AISI 304 Stainless Steel
resolves10.1149/1.1837169Electronic Structure of Passive Films Formed on Molybdenum‐Containing Ferritic Stainless Steels
resolves10.1149/1.1838880Semiconducting Properties of Passive Films Formed on Stainless Steels: Influence of the Alloying Elements
resolves10.1016/S0013-4686(01)00658-2Influence of the temperature of film formation on the electronic structure of oxide films formed on 304 stainless steel
resolves10.1016/0013-4686(95)98495-AThe nature of electronic states in anodic Zirconium oxide films part 2: Photoelectrochemical characterization
resolves10.1149/1.2086458Validation of a Percolation Model for Passivation of Fe‐Cr Alloys: Two‐Dimensional Computer Simulations
resolves10.5006/1.35820301989 Speller Award Lecture: Toward a More Fundamental Understanding of Corrosion Processes
The 7 references without a DOI — listed, not checked
no DOI — not checked10.1016/S0013-4686(02)00508-X_BIB4
no DOI — not checkedP. Schmuki, Thesis 1992, University of Zurich.
no DOI — not checkedJ.-S. Kim, E.-A. Cho, H.-S. Kwon, in: M.B. Ives, J.L. Luo, J. Rodda, Jasper (Eds.), Proceedings of 8th International Symposium on Passivity of Metals and Semiconductor, The Electrochemical Society, Pennington, NJ, PV 99-42, 2000, p. 141.
no DOI — not checkedS. Fujimoto, O. Chihara, K. Somiya, T. Shibata, in: M. Seo, B. MacDougall, H. Takahashi, R.G. Kelly, Hawaii (Eds.), Proceedings of Passivity and Localized Corrosion, The Electrochemical Society, Pennington, NJ, PV 99-27, 1999, p. 360.
no DOI — not checkedN. Sato, ‘DENKYOKUKAGAKU’, Japan Technical Information Service, 1 Japan, 1993 p. 269.
no DOI — not checkedH. Tsuchiya, S. Fujimoto, T. Shibata, to be submitted.
no DOI — not checkedS. Fujimoto, S. Kawachi, T. Shibata, in: M.B. Ives, J.L. Luo, J. Rodda (Eds.), Proceedings of 8th International Symposium on Passivity of Metals and Semiconductor, Jasper, Canada, May 1999, The Electrochemical Society, Pennington, NJ, PV 99-42, 2000, p. 260.
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