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Variable Resolution Fluctuation Electron Microscopy on Cu-Zr Metallic Glass Using a Wide Range of Coherent STEM Probe Size
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Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
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The 27 checked references that resolve
resolves10.1073/pnas.0905337106
X-ray cross correlation analysis uncovers hidden local symmetries in disordered matter
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Observation of the Role of Subcritical Nuclei in Crystallization of a Glassy Solid
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Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy
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Flexible formation of coherent probes on an aberration-corrected STEM with three condensers
resolves10.1016/S0304-3991(00)00013-9
Atom pair persistence in disordered materials from fluctuation microscopy
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Medium-range order in amorphous silicon measured by fluctuation electron microscopy
resolves10.1016/j.ultramic.2010.05.001
Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy
resolves10.1111/j.1365-2818.2007.01714.x
Fluctuation X‐ray microscopy: a novel approach for the structural study of disordered materials
resolves10.1103/PhysRevB.80.014202
Efficient local atomic packing in metallic glasses and its correlation with glass-forming ability
resolves10.1103/PhysRevLett.104.105701
Geometry of Slow Structural Fluctuations in a Supercooled Binary Alloy
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Properties of electron microdiffraction patterns from amorphous materials
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Structure and physical properties of paracrystalline atomistic models of amorphous silicon
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Comparison of fluctuation electron microscopy theories and experimental methods
resolves10.1016/j.ultramic.2007.11.004
A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite
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Increased medium-range order in amorphous silicon with increased substrate temperature
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On the breakdown of Friedel's Law for coherent microdiffraction from amorphous materials
resolves10.1557/jmr.2009.0386
Reverse Monte Carlo structural model for a zirconium-based metallic glass incorporating fluctuation microscopy medium-range order data
resolves10.1107/S0108767388006403
Visibility of single heavy atoms on thin crystalline silicon in simulated annular dark-field STEM images
The 4 references without a DOI — listed, not checked
no DOI — not checkedThe Structure of Non-Crystalline Materials
no DOI — not checkedVoyles P.M. (2001). Fluctuation electron microscopy of medium-range order in amorphous silicon. Dissertation. Urbana, IL: University of Illinois at Urbana-Champaign.
no DOI — not checkedNanometer-scale structural relaxation in Zr-based bulk metallic glass
no DOI — not checkedA cross-correlation measure of order in “amorphous” indium oxide
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