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Tribochemical Wear of Diamond-Like Carbon-Coated Atomic Force Microscope Tips

33/33 checkable references clean · checked 2026-07-22

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

The 33 checked references that resolve

resolves10.1088/0022-3727/41/10/103001

Aspects of scanning force microscope probes and their effects on dimensional measurement

resolves10.1116/1.4901413

Sub-20 nm silicon patterning and metal lift-off using thermal scanning probe lithography

resolves10.1002/adma.200904386

Probe‐Based 3‐D Nanolithography Using Self‐Amplified Depolymerization Polymers

resolves10.1063/1.1644317

Parallel dip-pen nanolithography with arrays of individually addressable cantilevers

resolves10.1016/j.ssc.2008.06.027

Nanolithography and manipulation of graphene using an atomic force microscope

resolves10.1021/nn100246g

Method for Characterizing Nanoscale Wear of Atomic Force Microscope Tips

resolves10.1002/smll.200901673

Preventing Nanoscale Wear of Atomic Force Microscopy Tips Through the Use of Monolithic Ultrananocrystalline Diamond Probes

resolves10.1038/nnano.2010.3

Ultralow nanoscale wear through atom-by-atom attrition in silicon-containing diamond-like carbon

resolves10.1002/smll.200500028

Novel Ultrananocrystalline Diamond Probes for High‐Resolution Low‐Wear Nanolithographic Techniques

resolves10.1116/1.585185

Can atomic force microscopy tips be inspected by atomic force microscopy?

resolves10.1007/BF00156907

Nano-wear of the diamond AFM probing tip under scratching of silicon, studied by AFM

resolves10.1063/1.1510595

Single asperity tribochemical wear of silicon nitride studied by atomic force microscopy

resolves10.1143/JJAP.41.4919

The Atomic-Scale Removal Mechanism during Si Tip Scratching on Si and SiO<sub>2</sub>Surfaces in Aqueous KOH with an Atomic Force Microscope

resolves10.1038/nnano.2012.255

Nanoscale wear as a stress-assisted chemical reaction

resolves10.1063/1.3223316

An energy-based model to predict wear in nanocrystalline diamond atomic force microscopy tips

resolves10.1016/j.actamat.2008.04.052

Thermally-treated Pt-coated silicon AFM tips for wear resistance in ferroelectric data storage

resolves10.1016/j.ultramic.2007.01.016

Wear characteristics of diamond-coated atomic force microscope probe

resolves10.1016/j.ultramic.2004.09.009

Characteristics of fracture during the approach process and wear mechanism of a silicon AFM tip

resolves10.1063/1.1721448

Contact and Rubbing of Flat Surfaces

resolves10.1103/PhysRevLett.101.125501

Atomistic Wear in a Single Asperity Sliding Contact

resolves10.1063/1.4818713

Large-scale molecular dynamics simulations of wear in diamond-like carbon at the nanoscale

resolves10.1007/s11249-010-9635-z

On the Application of Transition State Theory to Atomic-Scale Wear

resolves10.1038/ncomms11816

Critical length scale controls adhesive wear mechanisms

resolves10.1016/j.wear.2016.02.002

Adhesion suppresses atomic wear in single-asperity sliding

resolves10.1007/s11249-007-9209-x

Small amplitude reciprocating wear performance of diamond-like carbon films: dependence of film composition and counterface material

resolves10.1016/j.jmps.2012.09.003

Adhesion of nanoscale asperities with power-law profiles

resolves10.1016/0021-9797(75)90018-1

Effect of contact deformations on the adhesion of particles

resolves10.1016/j.jcis.2007.01.042

Using the Dugdale approximation to match a specific interaction in the adhesive contact of elastic objects

resolves10.1021/acsami.7b08023

Multibond Model of Single-Asperity Tribochemical Wear at the Nanoscale

resolves10.1021/nn501896e

Atomic-Scale Wear of Amorphous Hydrogenated Carbon during Intermittent Contact: A Combined Study Using Experiment, Simulation, and Theory

resolves10.1063/1.4937810

Characterizing nanoscale scanning probes using electron microscopy: A novel fixture and a practical guide

resolves10.1016/j.eml.2016.05.013

Measurement of the strength and range of adhesion using atomic force microscopy

resolves10.1117/12.271229

<title>Characterization of application-specific probes for SPMs</title>

What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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