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Exchange-Bias and Grain-Surface Relaxations in Nanostructured NiO/Ni Induced by a Particle Size Reduction

https://doi.org/10.1021/jp206658v
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27/27 checkable references clean · checked 2026-07-23

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

12 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 27 checked references that resolve
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The 12 references without a DOI — listed, not checked
no DOI — not checkedWarren, B. E.X-ray diffraction;Addison-Wesley Pub. Co. Inc.:Reading, MA, 1969; Chapter 13, pp251–314.
no DOI — not checkedWilson, A. J. C.Elements of X-ray Crystallography;Addison-Wesley Pub. Co. Inc.:Reading, MA, 1970; pp205–215.
no DOI — not checkedRodriguez-Carvajal, J.FullProf computer program, 2009; http://www.ill.eu/sites/fullprof/.
no DOI — not checkedNakamoto, K.Infrared and Raman Spectra of Inorganic and Coordination Compounds, Part B, Applications in Coordination, Organometallic and Bioinorganic Chemistry,5th ed.John Wiley & Sons:New York, 1997; pp59–62.
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no DOI — not checkedKinoshita, K.InModern aspects of electrochemistry;Bockris, J. O’M.; Conway, B. E.; White, R. E., Eds.Plenum:New York, 1982; pp557–637.
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