Reference health

Observation of rare-earth segregation in silicon nitride ceramics at subnanometre dimensions

https://doi.org/10.1038/nature02410
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14/14 checkable references clean · checked 2026-07-22

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

4 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 14 checked references that resolve
resolves10.1007/978-94-011-0992-5
Tailoring of Mechanical Properties of Si3N4 Ceramics
resolves10.1111/j.1151-2916.1973.tb12401.x
Relation Between Strength, Fracture Energy, and Microstructure of Hot‐Pressed Si <sub>3</sub> N <sub>4</sub>
resolves10.1111/j.1151-2916.1998.tb02702.x
Microstructural Design of Silicon Nitride with Improved Fracture Toughness: I, Effects of Grain Shape and Size
resolves10.1111/j.1151-2916.1998.tb02703.x
Microstructural Design of Silicon Nitride with Improved Fracture Toughness: II, Effects of Yttria and Alumina Additives
resolves10.1016/S1359-6454(99)00122-6
Debonding behavior between β-Si3N4 whiskers and oxynitride glasses with or without an epitaxial β-SiAlON interfacial layer
resolves10.1111/j.1151-2916.1993.tb04015.x
Grain Growth Studies of Silicon Nitride Dispersed in an Oxynitride Glass
resolves10.2109/jcersj.105.453
Structure and Chemistry of Interfaces in Si&lt;sub&gt;3&lt;/sub&gt;N&lt;sub&gt;4&lt;/sub&gt; Ceramics Studied by Transmission Electron Microscopy
resolves10.1111/j.1151-2916.1998.tb02747.x
Dopant Distribution in Grain‐Boundary Films in Calcia‐Doped Silicon Nitride Ceramics
resolves10.1111/j.1151-2916.2003.tb03554.x
Atomic Resolution Transmission Electron Microscopy of the Intergranular Structure of a Y <sub>2</sub> O <sub>3</sub> ‐Containing Silicon Nitride Ceramic
resolves10.1038/nature00972
Sub-ångstrom resolution using aberration corrected electron optics
resolves10.1016/S0304-3991(03)00090-1
Towards sub-0.5Å electron beams
resolves10.1016/0304-3991(91)90004-P
High-resolution Z-contrast imaging of crystals
resolves10.1016/S1076-5670(02)80063-5
Structure determination through Z-contrast microscopy
resolves10.1103/PhysRevB.50.7262
Symmetrized partial-wave method for density-functional cluster calculations
The 4 references without a DOI — listed, not checked
no DOI — not checkedChen, I. W., Becher, P. F., Mitomo, M., Petzow, G. & Yen, T.-S. (eds) Silicon Nitride Ceramics—Scientific and Technological Advances (MRS Proceedings, Mater. Res. Soc. 287, Pittsburgh, Pennsylvania, 1993)
no DOI — not checkedTani, E., Umebayashi, K., Kishi, K. & Kobayashi, K. Gas-pressure sintering of Si3N4 with concurrent addition of Al2O3 and 5wt% rare earth oxide: High fracture toughness Si3N4 with fiber-like structure. Am. Ceram. Soc. Bull 65, 1311–1315 (1986)
no DOI — not checkedHoffmann, M. J., Gu, H. & Cannon, R. M. in Interfacial Engineering for Optimized Properties II (eds Carter, C. B., Hall, E. L., Briant, C. L. & Nutt, S.) 65–74 (MRS Proceedings 586, Mater. Res. Soc., Warrendale, Pennsylvania, 2000)
no DOI — not checkedPainter, G. S., Becher, P. F., Shelton, W. A., Satet, R. L. & Hoffmann, M. J. Differential binding energies: effects of rare-earth additions on grain growth of β-Si3N4 and ceramic microstructure. Phys. Rev. Lett. submitted
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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