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Exchange biasing of magnetoelectric composites

https://doi.org/10.1038/nmat3306
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25/25 checkable references clean · checked 2026-07-23

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

3 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 25 checked references that resolve
resolves10.1002/adma.201003636
Recent Progress in Multiferroic Magnetoelectric Composites: from Bulk to Thin Films
resolves10.1063/1.1631756
Enhanced magnetoelectric effects in laminate composites of Terfenol-D/Pb(Zr,Ti)O3 under resonant drive
resolves10.1063/1.2137450
Frequency and field dependence of magnetoelectric interactions in layered ferromagnetic transition metal-piezoelectric lead zirconate titanate
resolves10.1103/PhysRevB.64.214408
Magnetoelectric bilayer and multilayer structures of magnetostrictive and piezoelectric oxides
resolves10.1063/1.3377908
Giant magnetoelectric coefficients in (Fe90Co10)78Si12B10-AlN thin film composites
resolves10.1063/1.3428774
Flexural deformation in a compositionally stepped ferrite and magnetoelectric effects in a composite with piezoelectrics
resolves10.1063/1.3662037
Energy harvesting properties of all-thin-film multiferroic cantilevers
resolves10.1088/0022-3727/40/17/003
A new magnetic recording read head technology based on the magneto-electric effect
resolves10.1103/PhysRev.105.904
New Magnetic Anisotropy
resolves10.1016/S0304-8853(98)00266-2
Exchange bias
resolves10.1063/1.373764
Exchange biasing by Ir19Mn81: Dependence on temperature, microstructure and antiferromagnetic layer thickness
resolves10.1063/1.1354581
Exchange enhancement and thermal anneal in Mn76Ir24 bottom-pinned spin valves
resolves10.1063/1.1486020
Thickness and angular dependencies of exchange bias in ferromagnetic/antiferromagnetic bilayers
resolves10.1103/PhysRevLett.95.057204
Origin of the Asymmetric Magnetization Reversal Behavior in Exchange-Biased Systems: Competing Anisotropies
resolves10.1063/1.3497277
Low damping resonant magnetoelectric sensors
resolves10.1016/0304-8853(81)90078-0
Biomagnetism
resolves10.1063/1.2147717
Competing functionality in multiferroic YMnO3
resolves10.1103/PhysRevLett.94.117203
Magnetoelectric Switching of Exchange Bias
resolves10.1063/1.2402204
Tunnel magnetoresistance and robust room temperature exchange bias with multiferroic BiFeO3 epitaxial thin films
resolves10.1038/nmat2803
Reversible electric control of exchange bias in a multiferroic field-effect device
resolves10.1063/1.3636098
Experimental evidence for exchange bias in polycrystalline BiFeO3/Ni81Fe19 thin films
resolves10.1109/TMAG.1976.1059251
The measurement of magnetostriction in ferromagnetic thin films
resolves10.1016/0304-8853(94)90464-2
Magnetostriction and internal stresses in thin films: the cantilever method revisited
resolves10.1016/S0304-8853(03)00562-6
Magnetoelastic interaction in magnetostrictive spring-magnet multilayers
resolves10.1109/TMAG.2002.802467
Optimization of the ΔE effect in thin films and multilayers by magnetic field annealing
The 3 references without a DOI — listed, not checked
no DOI — not checkedTadahiko, K. & Isao, S. Self bias magnetostrictive material. Japanese patent 09083037 A (1997).
no DOI — not checkedKantola, M. & Tokola, E. X-ray studies on the thermal expansion of copper–nickel alloys. Ann. Acad. Sci. Fennicae Ser. A6: Physica 223, 1–10 (1967).
no DOI — not checkedEllis, W. C. & Greiner, E. S. Equilibrium relations in the solid state of the iron–cobalt system. Trans. Am. Soc. Metals 29, 415–432 (1941).
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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