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Dielectric disorder in two-dimensional materials

https://doi.org/10.1038/s41565-019-0520-0
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47/47 checkable references clean · checked 2026-07-23

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

3 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

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The 3 references without a DOI — listed, not checked
no DOI — not checkedRytova, N. S. Screened potential of a point charge in a thin film. Proc. MSU Phys. Astron. 3, 30 (1967).
no DOI — not checkedKeldysh, L. V. Coulomb interaction in thin semiconductor and semimetal films. JETP Lett. 29, 658–661 (1979).
no DOI — not checkedCadiz, F. et al. Excitonic linewidth approaching the homogeneous limit in MoS2-based van der Waals heterostructures. Phys. Rev. X 7, 021026 (2017).
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