Reference health

Graphene-assisted metal transfer printing for wafer-scale integration of metal electrodes and two-dimensional materials

https://doi.org/10.1038/s41928-022-00764-4
CiteStamped reference-health badge
38/38 checkable references clean · checked 2026-07-22

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

1 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 38 checked references that resolve
resolves10.1039/C7CS00828G
Contact engineering for 2D materials and devices
resolves10.1038/nmat4452
Electrical contacts to two-dimensional semiconductors
resolves10.1021/acs.nanolett.9b02497
Contact Engineering High-Performance n-Type MoTe<sub>2</sub> Transistors
resolves10.1002/adma.201705540
Contact‐Engineered Electrical Properties of MoS<sub>2</sub> Field‐Effect Transistors via Selectively Deposited Thiol‐Molecules
resolves10.1021/acs.nanolett.7b04205
High-Performance WSe<sub>2</sub> Phototransistors with 2D/2D Ohmic Contacts
resolves10.1021/acs.nanolett.7b01536
Low-Temperature Ohmic Contact to Monolayer MoS<sub>2</sub> by van der Waals Bonded Co/<i>h</i>-BN Electrodes
resolves10.1038/nmat4080
Phase-engineered low-resistance contacts for ultrathin MoS2 transistors
resolves10.1021/acsnano.8b03331
Schottky Barrier Height Engineering for Electrical Contacts of Multilayered MoS<sub>2</sub> Transistors with Reduction of Metal-Induced Gap States
resolves10.1038/s41586-019-1052-3
Van der Waals contacts between three-dimensional metals and two-dimensional semiconductors
resolves10.1021/acsami.7b02739
Defect Dominated Charge Transport and Fermi Level Pinning in MoS<sub>2</sub>/Metal Contacts
resolves10.1021/nn500044q
Defect-Dominated Doping and Contact Resistance in MoS<sub>2</sub>
resolves10.1039/D0NR01379J
Gap state distribution and Fermi level pinning in monolayer to multilayer MoS <sub>2</sub> field effect transistors
resolves10.1021/acsami.5b01778
Surface Defects on Natural MoS<sub>2</sub>
resolves10.1021/acs.jpcc.8b10971
Universal Fermi-Level Pinning in Transition-Metal Dichalcogenides
resolves10.1021/acsnano.6b07159
Fermi Level Pinning at Electrical Metal Contacts of Monolayer Molybdenum Dichalcogenides
resolves10.1021/nl303583v
High Performance Multilayer MoS<sub>2</sub> Transistors with Scandium Contacts
resolves10.1021/nl403465v
The Unusual Mechanism of Partial Fermi Level Pinning at Metal–MoS<sub>2</sub> Interfaces
resolves10.1038/s41586-018-0129-8
Approaching the Schottky–Mott limit in van der Waals metal–semiconductor junctions
resolves10.1126/science.aat8126
Controlled crack propagation for atomic precision handling of wafer-scale two-dimensional materials
resolves10.1038/nature14417
High-mobility three-atom-thick semiconducting films with wafer-scale homogeneity
resolves10.1038/nature23905
Layer-by-layer assembly of two-dimensional materials into wafer-scale heterostructures
resolves10.1038/s41586-019-1870-3
Proton-assisted growth of ultra-flat graphene films
resolves10.1021/acsami.9b04791
Synthesis of Wafer-Scale Monolayer WS<sub>2</sub> Crystals toward the Application in Integrated Electronic Devices
resolves10.1021/acsnano.0c06750
Wafer-Scale Epitaxial Growth of Unidirectional WS<sub>2</sub> Monolayers on Sapphire
resolves10.1021/acs.nanolett.0c02531
Wafer-Scale Highly Oriented Monolayer MoS<sub>2</sub> with Large Domain Sizes
resolves10.1038/s41586-020-1939-z
Heterogeneous integration of single-crystalline complex-oxide membranes
resolves10.1038/nature22053
Remote epitaxy through graphene enables two-dimensional material-based layer transfer
resolves10.1016/j.apsusc.2020.147066
Wafer-scale fabrication of single-crystal graphene on Ge(110) substrate by optimized CH4/H2 ratio
resolves10.1126/science.1252268
Wafer-Scale Growth of Single-Crystal Monolayer Graphene on Reusable Hydrogen-Terminated Germanium
resolves10.1021/acs.nanolett.6b03137
Strong Fermi-Level Pinning at Metal/n-Si(001) Interface Ensured by Forming an Intact Schottky Contact with a Graphene Insertion Layer
resolves10.1557/PROC-203-163
Hardness and Adhesion Measurements of Copper Metallizations by a Continuous Indentation Approach
resolves10.1038/s41928-019-0245-y
Transferred via contacts as a platform for ideal two-dimensional transistors
resolves10.1103/PhysRevB.89.205417
Stability and electronic structures of native defects in single-layer<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mi mathvariant="normal">MoS</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:math>
resolves10.1073/pnas.1405435111
Strong interlayer coupling in van der Waals heterostructures built from single-layer chalcogenides
resolves10.1038/nmat3505
Tightly bound trions in monolayer MoS2
resolves10.1038/s41467-020-15776-x
Doping-free complementary WSe2 circuit via van der Waals metal integration
resolves10.1021/acsanm.0c01235
Large-Scale Atomically Thin Monolayer 2H-MoS<sub>2</sub> Field-Effect Transistors
resolves10.1002/adma.201304245
3D‐Transistor Array Based on Horizontally Suspended Silicon Nano‐bridges Grown via a Bottom‐Up Technique
The 1 reference without a DOI — listed, not checked
no DOI — not checkedLee, C. H. et al. Atomically thin p–n junctions with van der Waals heterointerfaces. Nat. Nanotechnol. 9, 676–681 (2014).
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

checked 2026-07-22 — re-checked daily as this page is visited; titles and statuses come from Crossref and DataCite and are not part of the signed record

Embed this badge

Both snippets point at the live badge image and link back to this page. The badge re-renders from the daily check, so an embed never goes stale by more than a day of visits.

<a href="https://citestamp.com/citestamped/10.1038/s41928-022-00764-4"><img src="https://citestamp.com/citestamped/10.1038/s41928-022-00764-4/badge.svg" alt="CiteStamped reference-health badge" width="460" height="64"></a>
[![CiteStamped reference-health badge](https://citestamp.com/citestamped/10.1038/s41928-022-00764-4/badge.svg)](https://citestamp.com/citestamped/10.1038/s41928-022-00764-4)