Reference health

Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique

https://doi.org/10.1063/1.1791321
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2 of 46 checkable references need attention · checked 2026-07-22

At the dated check, the references listed below either did not resolve in Crossref or DataCite, or carried a retraction notice. Each one is shown with the registry record that put it there.

3 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

References needing attention

does not resolve to a known work10.1002/(SICI)1521-4095(200002)12:4<298::AID-ADMA298>3.0.CO;2-Y
does not resolve to a known work10.1002/(SICI)1521-4095(199907)11:10<844::AID-ADMA844>3.0.CO;2-N
The 44 checked references that resolve
resolves10.1103/PhysRevLett.56.930
Atomic Force Microscope
resolves10.1126/science.267.5194.68
Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
resolves10.1007/s003390050912
True atomic resolution under ambient conditions obtained by atomic force microscopy in the contact mode
resolves10.1103/PhysRevLett.60.1314
Effect of tip profile on atomic-force microscope images: A model study
resolves10.1103/PhysRevB.52.8471
Effect of the tip structure on atomic-force microscopy
resolves10.1116/1.585846
Scanning probe tip geometry optimized for metrology by focused ion beam ion milling
resolves10.1116/1.587910
Dimensional metrology with scanning probe microscopes
resolves10.1016/0039-6028(92)90973-A
Imaging steep, high structures by scanning force microscopy with electron beam deposited tips
resolves10.1063/1.1142548
Atomic force microscopy using ZnO whisker tip
resolves10.1063/1.355313
Observation of contact holes by atomic force microscopy with a ZnO whisker tip
resolves10.1021/jp003948o
High-Yield Assembly of Individual Single-Walled Carbon Nanotube Tips for Scanning Probe Microscopies
resolves10.1038/384147a0
Nanotubes as nanoprobes in scanning probe microscopy
resolves10.1088/0957-4484/12/3/326
Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors
resolves10.1021/ja9737735
Carbon Nanotube Tips:  High-Resolution Probes for Imaging Biological Systems
resolves10.1063/1.1328046
Improved fabrication approach for carbon nanotube probe devices
resolves10.1063/1.1461073
Single-wall carbon nanotube atomic force microscope probes
resolves10.1063/1.1496139
Carbon nanotube scanning probe for profiling of deep-ultraviolet and 193 nm photoresist patterns
resolves10.1063/1.1452782
Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes
resolves10.1063/1.125526
WS 2 nanotubes as tips in scanning probe microscopy
resolves10.1063/1.1515120
High-resolution atomic force microscope nanotip grown by self-field emission
resolves10.1063/1.1529084
Field-emission induced growth of nanowires
resolves10.1063/1.1753975
VAPOR-LIQUID-SOLID MECHANISM OF SINGLE CRYSTAL GROWTH
resolves10.1063/1.1401089
Bulk synthesis of silicon nanowires using a low-temperature vapor–liquid–solid method
resolves10.1021/ja0040518
Catalytic Growth and Characterization of Gallium Nitride Nanowires
resolves10.1126/science.287.5457.1471
Control of Thickness and Orientation of Solution-Grown Silicon Nanowires
resolves10.1126/science.270.5243.1791
Solution-Liquid-Solid Growth of Crystalline III-V Semiconductors: An Analogy to Vapor-Liquid-Solid Growth
resolves10.1021/ja9640859
Solution−Liquid−Solid Growth of Indium Phosphide Fibers from Organometallic Precursors:  Elucidation of Molecular and Nonmolecular Components of the Pathway
resolves10.1002/(SICI)1521-4095(199907)11:10<847::AID-ADMA847>3.0.CO;2-B
A Novel Chemical Route to ZnTe Semiconductor Nanorods
resolves10.1126/science.279.5348.208
A Laser Ablation Method for the Synthesis of Crystalline Semiconductor Nanowires
resolves10.1126/science.281.5379.973
Coaxial Nanocable: Silicon Carbide and Silicon Oxide Sheathed with Boron Nitride and Carbon
resolves10.1016/S0038-1098(97)10143-0
Synthesis of nano-scale silicon wires by excimer laser ablation at high temperature
resolves10.1039/a700027h
A general template-based method for the preparation of nanomaterials
resolves10.1126/science.277.5330.1287
Synthesis of Gallium Nitride Nanorods Through a Carbon Nanotube-Confined Reaction
resolves10.1126/science.261.5126.1316
Fabrication and Magnetic Properties of Arrays of Metallic Nanowires
resolves10.1126/science.266.5187.1013
Conducting Carbon Wires in Ordered, Nanometer-Sized Channels
resolves10.1557/JMR.1997.0393
Nanostructured high-temperature superconductors: Creation of strong-pinning columnar defects in nanorod/superconductor composites
resolves10.1126/science.274.5294.1836
Fly Sex Drive Traced to <i>fru</i> Gene
resolves10.1063/1.126341
Direct synthesis of silicon nanowires, silica nanospheres, and wire-like nanosphere agglomerates
resolves10.1063/1.90934
Tungsten needles produced by decomposition of hexacarbonyltungsten
resolves10.1016/0022-0248(80)90127-X
Needle crystals arising from discharge-induced decomposition of hexacarbonyltungsten molecules
resolves10.1063/1.91310
Growth of metallic whisker crystals incorporated with field electron emission
resolves10.1070/PU1995v038n06ABEH000089
Ecton or electron avalanche from metal
resolves10.1116/1.589328
Field-emission processes from a liquid–metal surface
resolves10.1063/1.1616981
Thermal conductivity of individual silicon nanowires
The 3 references without a DOI — listed, not checked
no DOI — not checked2023070317370606700_r2
no DOI — not checked2023070317370606700_r45
no DOI — not checked2023070317370606700_r46
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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