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Intrinsic stress in thin films deposited on anisotropic substrates and its influence on the natural frequencies of piezoelectric resonators
17/17 checkable references clean · checked 2026-07-23
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
28 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 17 checked references that resolve
resolves10.1063/1.325084
Thermal stresses and cracking resistance of dielectric films (SiN, Si3N4, and SiO2) on Si substrates
resolves10.1016/0040-6090(78)90337-1
The temperature dependence of stresses in aluminum films on oxidized silicon substrates
resolves10.6028/jres.042.009
Calculation of stress in electrodeposits from the curvature of a plated strip
resolves10.1016/0022-5096(76)90023-5
The propagation of surface waves in bodies with material boundaries
resolves10.1016/0022-460X(77)90547-8
The effect of interfacial stress on the propagation of stoneley waves
resolves10.1103/PhysRev.133.A1604
Third-Order Elastic Constants and the Velocity of Small Amplitude Elastic Waves in Homogeneously Stressed Media
resolves10.1063/1.325940
Temperature dependence of the resonant frequency of electroded doubly-rotated quartz thickness-mode resonators
resolves10.1121/1.382031
Perturbation theory for linear electroelastic equations for small fields superposed on a bias
The 28 references without a DOI — listed, not checked
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