Reference health

Effect of defect-induced carrier scattering on the thermoelectric power of graphene

https://doi.org/10.1063/1.4989820
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27/27 checkable references clean · checked 2026-07-25

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

2 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 27 checked references that resolve
resolves10.1021/nn401933v
Gigahertz Integrated Graphene Ring Oscillators
resolves10.1021/nn404097s
Efficient Heat Dissipation of Photonic Crystal Microcavity by Monolayer Graphene
resolves10.1038/nnano.2010.172
Boron nitride substrates for high-quality graphene electronics
resolves10.1021/nl0731872
Superior Thermal Conductivity of Single-Layer Graphene
resolves10.1103/PhysRevB.82.073410
Two-dimensional carbon semiconductor: Density functional theory calculations
resolves10.1038/srep11962
Defect-Engineered Heat Transport in Graphene: A Route to High Efficient Thermal Rectification
resolves10.1063/1.3615290
Mechanical and thermal transport properties of graphene with defects
resolves10.1021/nn401992q
Conduction Tuning of Graphene Based on Defect-Induced Localization
resolves10.1038/ncomms4186
Effect of defects on the intrinsic strength and stiffness of graphene
resolves10.1039/C5CP04422G
Defect-engineered graphene chemical sensors with ultrahigh sensitivity
resolves10.1021/nn404746h
Enhanced Chemical Reactivity of Graphene Induced by Mechanical Strain
resolves10.1038/srep05085
A Bond-order Theory on the Phonon Scattering by Vacancies in Two-dimensional Materials
resolves10.1116/1.4926378
Precise control of defects in graphene using oxygen plasma
resolves10.1016/j.carbon.2009.12.057
Quantifying ion-induced defects and Raman relaxation length in graphene
resolves10.1021/nl201432g
Quantifying Defects in Graphene via Raman Spectroscopy at Different Excitation Energies
resolves10.1021/nl300901a
Probing the Nature of Defects in Graphene by Raman Spectroscopy
resolves10.1103/PhysRevB.64.075414
Resonant Raman spectroscopy of disordered, amorphous, and diamondlike carbon
resolves10.1088/2053-1583/aa57fc
Enhancement of graphene thermoelectric performance through defect engineering
resolves10.1103/PhysRevLett.102.096807
Thermoelectric and Magnetothermoelectric Transport Measurements of Graphene
resolves10.1103/PhysRevB.83.113403
Effect of charged impurities on the thermoelectric power of graphene near the Dirac point
resolves10.1103/PhysRevB.86.155414
Effect of carrier mobility on magnetothermoelectric transport properties of graphene
resolves10.1002/aelm.201500175
Enhancing the Thermoelectric Device Performance of Graphene Using Isotopes and Isotopic Heterojunctions
resolves10.1103/PhysRevLett.98.186806
Carrier Transport in Two-Dimensional Graphene Layers
resolves10.1073/pnas.0704772104
A self-consistent theory for graphene transport
resolves10.1038/nphys935
Charged-impurity scattering in graphene
resolves10.1103/PhysRevLett.116.136802
Enhanced Thermoelectric Power in Graphene: Violation of the Mott Relation by Inelastic Scattering
resolves10.1103/PhysRevLett.102.166808
Anomalous Thermoelectric Transport of Dirac Particles in Graphene
The 2 references without a DOI — listed, not checked
no DOI — not checkedSemiconductor Thermoelements and Thermoelectric Cooling
no DOI — not checkedSemiconductor Physics: An Introduction
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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