Reference health
The piezoresistive mobility modeling for cubic and hexagonal silicon carbide crystals
16/16 checkable references clean · checked 2026-07-22
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
3 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 16 checked references that resolve
resolves10.1109/IEDM.2005.1609286
Physical mechanisms of electron mobility enhancement in uniaxial stressed MOSFETs and impact of uniaxial stress engineering in ballistic regime
resolves10.1109/JMEMS.2015.2470132
The Piezoresistive Effect of SiC for MEMS Sensors at High Temperatures: A Review
resolves10.1109/16.285013
Characterization of monolithic n-type 6H-SiC piezoresistive sensing elements
resolves10.1063/1.1728280
Semiconducting Stress Transducers Utilizing the Transverse and Shear Piezoresistance Effects
resolves10.1109/LED.2017.2700402
Experimental Investigation of Piezoresistive Effect in p-Type 4H–SiC
resolves10.1088/0960-1317/22/8/085034
Design-dependent gauge factors of highly doped n-type 4H-SiC piezoresistors
resolves10.1063/1.4869151
Fundamental piezoresistive coefficients of p-type single crystalline 3C-SiC
resolves10.1007/s40094-015-0183-7
Elastic and thermodynamical properties of cubic (3C) silicon carbide under high pressure and high temperature
The 3 references without a DOI — listed, not checked
no DOI — not checkedPiezoresistor Design and Applications
no DOI — not checked2023080902071949200_c13
no DOI — not checked2023080902071949200_c19
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checked 2026-07-22 — re-checked daily as this page is visited; titles and statuses come from Crossref and DataCite and are not part of the signed record
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