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Formation of submicroscopic vacancy clusters and radiation-induced refining in metals by electron-irradiation at high temperatures

https://doi.org/10.1080/00337578208225740
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18/18 checkable references clean · checked 2026-07-22

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

10 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 18 checked references that resolve
resolves10.1016/0022-3115(78)90249-0
Dynamic studies of defect mobility using high voltage electron microscopy
resolves10.1080/14786436908216330
The influence of boron on the clustering of radiation damage in graphite
resolves10.1143/JPSJ.39.170
Electron Radiation Damage of Iron in High Voltage Electron Microscope
resolves10.1080/01418617908234874
Mobility of lattice vacancies in iron
resolves10.1143/JPSJ.35.1418
Point Defect Clusters in Electron-Irradiated Gold
resolves10.1002/pssa.2210060120
Growth of Defect Clusters in Thin Nickel Foils during Electron Irradiation. II. Temperature Dependence of the Growth Rate of Interstitial Loops
resolves10.1143/JPSJ.38.1677
Growth of Interstitial Type Dislocation Loops and Vacancy Mobility in Electron Irradiated Metals
resolves10.1063/1.1723032
Radiation Enhanced Diffusion in Solids
resolves10.1016/0022-3115(78)90256-8
The effect of radiation upon diffusion in metals
resolves10.1103/PhysRevB.8.553
Anisotropy of the Threshold Energy for Production of Frenkel Pairs in Copper and Platinum
resolves10.1016/0022-3115(78)90247-7
Vacancy defect mobilities and binding energies obtained from annealing studies
resolves10.1143/JPSJ.38.1220
Directional Arrangement of Defect Clusters in Electron-Irradiated Copper
resolves10.1143/JPSJ.35.95
Analysis of the Clustering Process of Supersaturated Lattice Vacancies
resolves10.1016/0022-3115(74)90267-0
Segregation of alloying elements to free surfaces during irradiation
resolves10.1016/0022-3115(79)90587-7
Radiation-induced segregation in binary and ternary alloys
resolves10.1103/PhysRevB.23.3333
Solid solutions under irradiation. II. Radiation-induced precipitation in AlZn undersaturated solid solutions
resolves10.1088/0034-4885/27/1/305
Matter transport in solids
resolves10.1016/0001-6160(80)90140-6
Expressions microscopiques des flux de solute et d'interstitiels dans des gradients de concentration de solute et d'interstitiels pour un cristal de structure c.f.c.
The 10 references without a DOI — listed, not checked
no DOI — not checkedUrban, K. 1976. “Fundamental aspects of radiation damage in metals”. 675US ERDA Oak Ridge/Tenn. CONF-751006
no DOI — not checkedKiritani, M. 1976. “Fundamental aspects of radiation damage in metals”. 695US ERDA Oak Ridge/Tenn. CONF-75006
no DOI — not checkedUrban, K. 1975.Microscopie Electronique à Haute Tension, 159Paris: SFME.
no DOI — not checkedUrban, K. 1980, 1980.Electron Microscopy, Vol. 4, 188Leiden: EM Congress Foundation.
no DOI — not checkedKiritani, M. 1980, 980.Electron Microscopy, Vol. 4, 196Leiden: EM Congress Foundation.
no DOI — not checkedSeeger, A. 1976. “Fundamental aspects of radiation damage in metals”. 493US ERDA, Oak Ridge/Tenn. CONF-75006
no DOI — not checkedDiising, G., Hemmerich, H., Sassin, W. and Schilling, W. Proc. Int. Conf. Vacancies and Interstitials in Metals. pp.246Jülich.
no DOI — not checkedJsäger, W. and Urban, K. 1975. “Microscopie Electronique à Haute Tension”. 175Paris: SFME.
no DOI — not checkedThesis
no DOI — not checkedCauvin, R. and Martin, G. Proc. Int. Conf. on Solid-Solid Phase Transformations. Pittsburgh/Penn. in press
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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