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All-metal AFM probes fabricated from microstructurally tailored Cu–Hf thin films

https://doi.org/10.1088/0957-4484/20/34/345703
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35/35 checkable references clean · checked 2026-07-22

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

The 35 checked references that resolve
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