Every reference with a DOI in the deposited reference list resolved to a known
work in Crossref or DataCite at the dated check, and none carried a retraction,
withdrawal, or removal notice.
The 35 checked references that resolve
resolves10.1116/1.576520Microfabrication of cantilever styli for the atomic force microscope
resolves10.1063/1.103677Improved atomic force microscope images using microcantilevers with sharp tips
resolves10.1088/0957-4484/20/4/045702Degeneracy and instability of nanocontacts between conductive tips and hydrogenated nanocrystalline Si surfaces in conductive atomic force microscopy
resolves10.1063/1.108460Thermomechanical writing with an atomic force microscope tip
resolves10.1088/0957-4484/19/47/475302Conductive polymer patterned media fabricated by diblock copolymer lithography for scanning multiprobe data storage
resolves10.1002/sca.20074Thermomechanical Formation and Recovery of Nanoindents in a Shape Memory Polymer Studied Using a Heated Tip
resolves10.1088/0957-4484/19/10/105705Nanomechanical and nanotribological characterization of noble metal-coated AFM tips for probe-based ferroelectric data recording
resolves10.1116/1.589753New approaches to atomic force microscope lithography on silicon
resolves10.1002/sca.4950170208Improvement of thermally induced bending of cantilevers used for atomic force microscopy
resolves10.1109/84.825785Microfabricated small metal cantilevers with silicon tip for atomic force microscopy
resolves10.1088/0957-4484/19/12/125705Tailoring the microstructure and surface morphology of metal thin films for nano-electro-mechanical systems applications
resolves10.1557/jmr.2004.19.1.3Measurement of hardness and elastic modulus by instrumented indentation: Advances in understanding and refinements to methodology
resolves10.1063/1.363701Measurements of stress during vapor deposition of copper and silver thin films and multilayers
resolves10.1346/CCMN.1997.0450315XRD Measurement of Mean Crystallite Thickness of Illite and Illite/Smectite: Reappraisal of the Kubler Index and the Scherrer Equation
resolves10.1063/1.2841849Resonance properties and microstructure of ultracompliant metallic nanoelectromechanical systems resonators synthesized from Al–32at.%Mo amorphous-nanocrystalline metallic composites
resolves10.1103/PhysRev.161.756Electronic Effects in the Elastic Constants of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>n</mml:mi></mml:math>-Type Silicon
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