Reference health
Fast Fourier transform scanning spreading resistance microscopy: a novel technique to overcome the limitations of classical conductive AFM techniques
17/17 checkable references clean · checked 2026-07-23
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
9 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 17 checked references that resolve
resolves10.1103/PhysRevLett.89.025502
Mapping of Electrostatic Potential in Deep Submicron CMOS Devices by Electron Holography
resolves10.1063/1.114207
Quantitative two-dimensional dopant profile measurement and inverse modeling by scanning capacitance microscopy
resolves10.1116/1.1627792
Two-dimensional characterization of carrier concentration in metal-oxide-semiconductor field-effect transistors with the use of scanning tunneling microscopy
resolves10.1007/978-0-387-28668-6_3
Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy
resolves10.1063/1.1490399
Three-dimensional carrier profiling of InP-based devices using scanning spreading resistance microscopy
resolves10.1016/j.ultramic.2012.10.008
Quantitative three-dimensional carrier mapping in nanowire-based transistors using scanning spreading resistance microscopy
resolves10.1149/1.2355836
2D-TCAD Process Calibration for a High Speed QSA SiGe:C HBT Verified with SSRM
resolves10.1149/1.3700460
Integration of InGaAs Channel n-MOS Devices on 200mm Si Wafers Using the Aspect-Ratio-Trapping Technique
resolves10.1016/j.sse.2012.04.009
Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations
resolves10.1088/0957-4484/22/18/185701
Observation of diameter dependent carrier distribution in nanowire-based transistors
resolves10.1063/1.126109
Highly conductive diamond probes for scanning spreading resistance microscopy
resolves10.1063/1.4795141
A comprehensive model for the electrical nanocontact on germanium for scanning spreading resistance microscopy applications
resolves10.1116/1.2805250
Impact of the environmental conditions on the electrical characteristics of scanning spreading resistance microscopy
resolves10.1109/TED.2014.2327759
Accurate Prediction of Device Performance Based on 2-D Carrier Profiles in the Presence of Extensive Mobile Carrier Diffusion
The 9 references without a DOI — listed, not checked
no DOI — not checked6
no DOI — not checked8
no DOI — not checked10
no DOI — not checked11
no DOI — not checked12
no DOI — not checked14
no DOI — not checked19
no DOI — not checked21
no DOI — not checked23
What this badge says. CiteStamped means the CHECKABLE references of this
work were clean at the dated check: each resolved to a known work in a public registry, and none
carried a retraction notice at that time. It says nothing about the quality, findings,
or importance of the work itself, and nothing about references deposited without a DOI.
checked 2026-07-23 — re-checked daily as this page is visited; titles and statuses come from Crossref and DataCite and are not part of the signed record
Embed this badge
Both snippets point at the live badge image and link back to this page. The badge re-renders from the daily check, so an embed never goes stale by more than a day of visits.
<a href="https://citestamp.com/citestamped/10.1088/0957-4484/26/35/355702"><img src="https://citestamp.com/citestamped/10.1088/0957-4484/26/35/355702/badge.svg" alt="CiteStamped reference-health badge" width="460" height="64"></a>
[](https://citestamp.com/citestamped/10.1088/0957-4484/26/35/355702)