Site effect on the impurity levels in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mn>4</mml:mn><mml:mi>H</mml:mi></mml:math>,<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mn>6</mml:mn><mml:mi>H</mml:mi></mml:math>, and<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mn>1</mml:mn><mml:mn>5</mml:mn><mml:mi>R</mml:mi></mml:math>SiC
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Luminescence of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mn>4</mml:mn><mml:mi>H</mml:mi></mml:math>SiC, and Location of Conduction-Band Minima in SiC Polytypes
Kohn-Luttinger Interference Effect and Location of the Conduction-Band Minima in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mn>6</mml:mn><mml:mi>H</mml:mi><mml:mi> </mml:mi><mml:mi mathvariant="normal">SiC</mml:mi></mml:math>
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no DOI — not checkedPhysRevB.22.2842Cc7R1
no DOI — not checkedPhysRevB.22.2842Cc8R1
no DOI — not checkedPhysRevB.22.2842Cc9R1
no DOI — not checkedSilicon Carbide—1973
no DOI — not checkedPhysRevB.22.2842Cc11R1
no DOI — not checkedPhysRevB.22.2842Cc13R1
no DOI — not checkedPhysRevB.22.2842Cc17R1
no DOI — not checkedSilicon Carbide—1973
no DOI — not checkedPhysRevB.22.2842Cc28R1
no DOI — not checkedPhysRevB.22.2842Cc29R1
no DOI — not checkedPhysRevB.22.2842Cc30R1
no DOI — not checkedPhysRevB.22.2842Cc31R1
no DOI — not checkedPhysRevB.22.2842Cc32R1
no DOI — not checkedDynamic Processes in Solid State Optics
no DOI — not checkedPhysRevB.22.2842Cc39R2
no DOI — not checkedElectroluminescence
no DOI — not checkedPhysRevB.22.2842Cc42R1
no DOI — not checkedPhysRevB.22.2842Cc43R1
no DOI — not checkedSilicon Carbide—1973
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