Every reference with a DOI in the deposited reference list resolved to a known
work in Crossref or DataCite at the dated check, and none carried a retraction,
withdrawal, or removal notice.
The 54 checked references that resolve
resolves10.1143/JJAP.33.3193Strain Imaging of Lead-Zirconate-Titanate Thin Film by Tunneling Acoustic Microscopy
resolves10.1143/JJAP.36.2207Scanning Force Microscopy Studies of Domain Structure in BaTiO<sub>3</sub> Single Crystals
resolves10.1063/1.126954Role of 90° domains in lead zirconate titanate thin films
resolves10.1143/JJAP.37.L939Characterization and Control of Domain Structure in SrBi<sub>2</sub>Ta<sub>2</sub>O<sub>9</sub>Thin Films by Scanning Force Microscopy
resolves10.1063/1.370774High resolution study of domain nucleation and growth during polarization switching in Pb(Zr,Ti)O3 ferroelectric thin film capacitors
resolves10.1063/1.121083Direct observation of region by region suppression of the switchable polarization (fatigue) in Pb(Zr,Ti)O3 thin film capacitors with Pt electrodes
resolves10.1063/1.373492Spatial variation of ferroelectric properties in Pb(Zr0.3, Ti0.7)O3 thin films studied by atomic force microscopy
resolves10.1063/1.117957Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O3 films
resolves10.1063/1.372440Effect of phase transition on the surface potential of the BaTiO3 (100) surface by variable temperature scanning surface potential microscopy
resolves10.1103/PhysRevB.61.203<i>In situ</i>observation of the ferroelectric-paraelectric phase transition in a triglycine sulfate single crystal by variable-temperature electrostatic force microscopy
resolves10.1063/1.1348303Temperature dependence of polarization and charge dynamics on the BaTiO3(100) surface by scanning probe microscopy
resolves10.1016/S0039-6028(01)00992-XStress induced movement of ferroelastic domain walls in BaTiO3 single crystals evaluated by scanning force microscopy
resolves10.1063/1.124628Switching properties of self-assembled ferroelectric memory cells
resolves10.1063/1.125485Scaling of ferroelectric and piezoelectric properties in Pt/SrBi2Ta2O9/Pt thin films
resolves10.1063/1.124822Patterning and switching of nanosize ferroelectric memory cells
resolves10.1063/1.125756Investigations into local piezoelectric properties by atomic force microscopy
resolves10.1143/JJAP.38.L264Detection Mechanism of Spontaneous Polarization in Ferroelectric Thin Films Using Electrostatic Force Microscopy
resolves10.1063/1.124722Scaling effect on statistical behavior of switching parameters of ferroelectric capacitors
resolves10.1063/1.1149660Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope
resolves10.1103/PhysRevB.58.5078Surface charge density and evolution of domain structure in triglycine sulfate determined by electrostatic-force microscopy
resolves10.1063/1.123266Nanoscale reconstruction of surface crystallography from three-dimensional polarization distribution in ferroelectric barium–titanate ceramics
resolves10.1063/1.367462Nondestructive imaging and characterization of ferroelectric domains in periodically poled crystals
resolves10.1063/1.1328049Differentiating 180° and 90° switching of ferroelectric domains with three-dimensional piezoresponse force microscopy
resolves10.1063/1.371882Dynamical studies of the ferroelectric domain structure in triglycine sulfate by voltage-modulated scanning force microscopy
resolves10.1557/JMR.2001.0050Analysis of phase distributions in the Li<sub>2</sub>O–Nb<sub>2</sub>O<sub>5</sub>–TiO<sub>2</sub> system by piezoresponse imaging
resolves10.1063/1.1331654Principle of ferroelectric domain imaging using atomic force microscope
resolves10.1119/1.1341252Screening of a point charge by an anisotropic medium: Anamorphoses in the method of images
resolves10.1063/1.368181Resolution and contrast in Kelvin probe force microscopy
resolves10.1016/S0020-7683(99)00027-XThe elastic and electric fields for three-dimensional contact for transversely isotropic piezoelectric materials
resolves10.1080/13642810008208596Point force and point electric charge in infinite and semi-infinite transversely isotropic piezoelectric solids
resolves10.1063/1.1366644Asymmetric nanoscale switching in ferroelectric thin films by scanning force microscopy
resolves10.1063/1.121788Noncontact scanning probe microscope potentiometry of surface charge patches: Origin and interpretation of time-dependent signals
resolves10.1116/1.590851Surface potential of ferroelectric thin films investigated by scanning probe microscopy
resolves10.1143/JJAP.38.3932Investigation of Surface Potential of Ferroelectric Organic Molecules by Scanning Probe Microscopy
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