Reference health
First-principles study of rare-earth effects on grain growth and microstructure in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi>β</mml:mi><mml:msub><mml:mrow><mml:mtext>−</mml:mtext><mml:mi mathvariant="normal">Si</mml:mi></mml:mrow><mml:mn>3</mml:mn></mml:msub><mml:msub><mml:mi mathvariant="normal">N</mml:mi><mml:mn>4</mml:mn></mml:msub></mml:mrow></mml:math>ceramics
13/13 checkable references clean · checked 2026-07-22
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
4 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 13 checked references that resolve
resolves10.1016/j.jeurceramsoc.2003.10.034
Grain growth anisotropy of β-silicon nitride in rare-earth doped oxynitride glasses
resolves10.1111/j.1151-2916.1993.tb04015.x
Grain Growth Studies of Silicon Nitride Dispersed in an Oxynitride Glass
resolves10.2109/jcersj.107.995
Control of .BETA.-Si3N4 Crystal Morphology and Its Mechanism. (Part 2). Effect of Lanthanide Additives.
resolves10.1111/j.1151-2916.1998.tb02703.x
Microstructural Design of Silicon Nitride with Improved Fracture Toughness: II, Effects of Yttria and Alumina Additives
resolves10.1111/j.1151-2916.1998.tb02702.x
Microstructural Design of Silicon Nitride with Improved Fracture Toughness: I, Effects of Grain Shape and Size
resolves10.1016/S1359-6454(99)00122-6
Debonding behavior between β-Si3N4 whiskers and oxynitride glasses with or without an epitaxial β-SiAlON interfacial layer
resolves10.1111/j.1151-2916.1998.tb02375.x
Calculation of Grain‐Boundary Bonding in Rare‐Earth‐Doped β‐Si
<sub>3</sub>
N
<sub>4</sub>
resolves10.1103/PhysRevB.50.7262
Symmetrized partial-wave method for density-functional cluster calculations
resolves10.1103/PhysRevB.47.3053
Structure of rings in vitreous<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">SiO</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>
resolves10.1111/j.1151-2916.2002.tb00033.x
Solubility of Si
<sub>3</sub>
N
<sub>4</sub>
in Liquid SiO
<sub>2</sub>
resolves10.1111/j.1151-2916.2003.tb03554.x
Atomic Resolution Transmission Electron Microscopy of the Intergranular Structure of a Y
<sub>2</sub>
O
<sub>3</sub>
‐Containing Silicon Nitride Ceramic
resolves10.1038/nature02410
Observation of rare-earth segregation in silicon nitride ceramics at subnanometre dimensions
The 4 references without a DOI — listed, not checked
no DOI — not checkedStructure and Bonding
no DOI — not checkedTailoring of Mechanical Properties of Si3N4 Ceramics, NATO ASI Series, Series E, Applied Sciences
no DOI — not checkedInterfacial Engineering for Optimized Properties II
no DOI — not checkedDensity Functional Theory II
What this badge says. CiteStamped means the CHECKABLE references of this
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carried a retraction notice at that time. It says nothing about the quality, findings,
or importance of the work itself, and nothing about references deposited without a DOI.
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