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The effects of various annealing regimes on the microstructure and physical properties of ITO (In2O3:Sn) thin films deposited by electron beam evaporation for solar energy applications
Synthesis and characterization of Sb-doped SnO2-(CeO2-TiO2) composite thin films deposited on glass substrates for antistatic electricity and UV-shielding
Integration of ZnO and CuO nanowires into a thermoelectric module
The 16 references without a DOI — listed, not checked
no DOI — not checkedUser Manual for JCI-Graph
no DOI — not checkedUser Manual: JCI 176 Charge Measuring Sample Support
no DOI — not checkedUser Manual: JCI 155v5 Charge Decay Test Unit
no DOI — not checkedCorona charging of practical materials for charge decay measurements
no DOI — not checkedNew figure of merit
no DOI — not checkedScience and technology of nanostructured magnetic materials
no DOI — not checkedInternational Standard (2015), Electrostatics – Part 2-1: Measurement methods – Ability of materials and products to dissipate static electric charge, IEC 61340-2-1.
no DOI — not checkedX-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials
no DOI — not checkedIT0 films for antireflective and antistatic tube coatings prepared by d.c. magnetron sputtering
no DOI — not checkedAmorphous to crystalline transition and optoelectronic properties of nanocrystalline indium tin oxide (ITO) films sputtered with high rf power at room temperature
no DOI — not checkedStudy of the morphological change of amorphous ITO films after temperature-humidity treatment
no DOI — not checkedA study of low temperature crystallization of amorphous thin film indium-tin-oxide
no DOI — not checkedThickness dependence of In2O3: Sn film growth
no DOI — not checkedSemiconductor Material and Device Characterization
no DOI — not checkedLarge scale antireflective coatings on glass produced by reactive magnetron sputtering
no DOI — not checkedIndium tin oxide films prepared by radio frequency magnetron sputtering method at a low processing temperature
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