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Effect of thickness on optoelectronic properties of ITO thin films

https://doi.org/10.1108/cw-11-2019-0170
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Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

16 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

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no DOI — not checkedIT0 films for antireflective and antistatic tube coatings prepared by d.c. magnetron sputtering
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no DOI — not checkedA study of low temperature crystallization of amorphous thin film indium-tin-oxide
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