Reference health

Effect of excitation voltage and lead wire resistance on strain measurement

https://doi.org/10.1109/i2ct.2017.8226228
CiteStamped reference-health badge
3/3 checkable references clean · checked 2026-07-22

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

20 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 3 checked references that resolve
resolves10.1088/0026-1394/40/2/307
Error analysis in the evaluation of measurement uncertainty
resolves10.21307/ijssis-2017-362
Uncertainty Analysis of Strain Gage Circuits: Interval Method And Interval Algorithm
resolves10.1002/9780470485682
Experimentation, Validation, and Uncertainty Analysis for Engineers
The 20 references without a DOI — listed, not checked
no DOI — not checkedVishay Micro-Measurements, Errors due to Wheatstone bridge nonlinearity
no DOI — not checkedUncertainties associated with strain measuring systems using resistance strain gauges
no DOI — not checkedValidation of experimental strain measurement technique and development of force transducer
no DOI — not checkedOptimization of position of strain gauge using geometrical parameter of sensors substrate
no DOI — not checkedVirtual instrumentation for measurement of strain using thin film strain gauge
no DOI — not checkedref16
no DOI — not checkedref17
no DOI — not checkedref18
no DOI — not checkedref19
no DOI — not checkedExperimental and analytical study for uncertainty in strain measurement
no DOI — not checkedDesign and development of a new load cell
no DOI — not checkedSensitivity enhancement of wheatstone bridge circuit for resistance measurement
no DOI — not checkedVishay Micro-Measurements, Errors due to transverse sensitivity in strain gauges
no DOI — not checkedVishay Micro-Measurements, Strain gauge thermal output and gauge factor variation with temperature
no DOI — not checkedref2
no DOI — not checkedref1
no DOI — not checkedApplication to B & K Equipment to Strain Measurement
no DOI — not checkedErrors in shunt calibration of strain gauge circuits due to cable resistance
no DOI — not checkedref22
no DOI — not checkedVishay Micro-Measurements, Shunt calibration of strain gauge instrumentation
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

checked 2026-07-22 — re-checked daily as this page is visited; titles and statuses come from Crossref and DataCite and are not part of the signed record

Embed this badge

Both snippets point at the live badge image and link back to this page. The badge re-renders from the daily check, so an embed never goes stale by more than a day of visits.

<a href="https://citestamp.com/citestamped/10.1109/i2ct.2017.8226228"><img src="https://citestamp.com/citestamped/10.1109/i2ct.2017.8226228/badge.svg" alt="CiteStamped reference-health badge" width="460" height="64"></a>
[![CiteStamped reference-health badge](https://citestamp.com/citestamped/10.1109/i2ct.2017.8226228/badge.svg)](https://citestamp.com/citestamped/10.1109/i2ct.2017.8226228)