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Silicon Heterojunction Solar Cells With Copper-Plated Grid Electrodes: Status and Comparison With Silver Thick-Film Techniques

https://doi.org/10.1109/jphotov.2014.2321663
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20/20 checkable references clean · checked 2026-07-23

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

11 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 20 checked references that resolve
resolves10.1002/pip.4670020103
Decreased emitter sheet resistivity loss in high‐eficiency silicon solar cells
resolves10.1016/j.solmat.2013.11.029
Silicon heterojunction rear emitter solar cells: Less restrictions on the optoelectrical properties of front side TCOs
resolves10.1063/1.3641899
Improved amorphous/crystalline silicon interface passivation by hydrogen plasma treatment
resolves10.1016/j.solmat.2013.03.024
Hydrogen-doped indium oxide/indium tin oxide bilayers for high-efficiency silicon heterojunction solar cells
resolves10.1063/1.4772975
Infrared light management in high-efficiency silicon heterojunction and rear-passivated solar cells
resolves10.1038/lsa.2013.62
Improving metal reflectors by suppressing surface plasmon polaritons: a priori calculation of the internal reflectance of a solar cell
resolves10.1016/j.solmat.2013.06.024
Parasitic absorption in the rear reflector of a silicon solar cell: Simulation and measurement of the sub-bandgap reflectance for common dielectric/metal reflectors
resolves10.1515/green-2011-0018
High-efficiency Silicon Heterojunction Solar Cells: A Review
resolves10.1063/1.4764529
Damage at hydrogenated amorphous/crystalline silicon interfaces by indium tin oxide overlayer sputtering
resolves10.1063/1.3129578
Nature of doped a-Si:H/c-Si interface recombination
resolves10.1016/S0026-2714(00)00227-4
Improved estimation of the resistivity of pure copper and electrical determination of thin copper film dimensions
resolves10.1007/s10800-009-0054-5
Electrochemical methods to analyse the light-induced plating process
resolves10.1155/2008/759340
Analysis of the Optical Properties of Screen‐Printed and Aerosol‐Printed and Plated Fingers of Silicon Solar Cells
resolves10.1002/pip.1125
Ag requirements for silicon wafer‐based solar cells
resolves10.1016/j.egypro.2012.05.006
Electroless nickel deposition and silicide formation for advanced front side metallization of industrial silicon solar cells
resolves10.1002/pip.2221
Evolution of metal plating for silicon solar cell metallisation
resolves10.1149/1.1860511
ITO as a Diffusion Barrier Between Si and Cu
resolves10.1109/JPHOTOV.2012.2209407
>21% Efficient Silicon Heterojunction Solar Cells on n- and p-Type Wafers Compared
resolves10.1016/j.apsusc.2009.04.001
Failure behavior of ITO diffusion barrier between electroplating Cu and Si substrate annealed in a low vacuum
resolves10.1016/0038-1101(72)90048-2
Models for contacts to planar devices
The 11 references without a DOI — listed, not checked
no DOI — not checkedHeterojunction solar cells with electroplated Ni/Cu front electrode
no DOI — not checkedMetallization for silicon heterojunction solar cells
no DOI — not checkedNew concepts for the front side metallization of silicon solar cells
no DOI — not checkedref29
no DOI — not checkedAdvances in electroless nickel plating for the metallization of silicon solar cells using different structuring techniques for the ARC
no DOI — not checkedHigh efficiency copper electroplated heterojunction solar cells
no DOI — not checkedKey aspects on development of high efficiency heterojunction and IBC-heterojunction solar cells: Towards 22% efficiency on industrial size
no DOI — not checkedInternational Technology Roadmap for Photovoltaics (ITRPV.net): Results 2012
no DOI — not checkedInkjet printing for solar cell mass production on the PiXDRO JETx platform
no DOI — not checkedHigh efficiency copper electroplated heterojunction solar cells and modules—The path towards 25% cell efficiency
no DOI — not checkedSmart wire connection technology
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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