Reference health
Source-Drain Series Resistance Model for <i>N</i>-Stack Nanosheet FETs Using Transmission Line Matrix Method
25/25 checkable references clean · checked 2026-07-23
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
5 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 25 checked references that resolve
resolves10.1109/delcon54057.2022.9753432
Simulation Study: Process, Device and Circuit Implementation of Tubs in the BOX (TBOX) cSiGe PMOSFET having low Off State Leakage Current
resolves10.1109/ted.2019.2903546
Fringe Capacitance Modeling in NanoPlate MOSFET Using Conformal Mapping
resolves10.1109/ted.2023.3281530
Parasitic Capacitance Model for Stacked Gate-All-Around Nanosheet FETs
resolves10.1109/16.987117
Advanced model and analysis of series resistance for CMOS scaling into nanometer regime. I. Theoretical derivation
resolves10.1109/TED.2009.2028377
Modeling and Analysis of Parasitic Resistance in Double-Gate FinFETs
resolves10.1109/TED.2022.3143473
Analytical Model of Contact Resistance in Vertically Stacked Nanosheet FETs for Sub-3-nm Technology Node
resolves10.1109/TED.2023.3270398
Analytical Parasitic Resistance and Capacitance Models for Nanosheet Field-Effect Transistors
resolves10.1109/TED.2020.2988858
A Predictive 3-D Source/Drain Resistance Compact Model and the Impact on 7 nm and Scaled FinFETs
resolves10.1109/TED.2017.2673859
Impact of Equivalent Oxide Thickness on Threshold Voltage Variation Induced by Work-Function Variation in Multigate Devices
resolves10.1109/TED.2020.3019022
Design Optimization Techniques in Nanosheet Transistor for RF Applications
resolves10.1109/T-ED.1983.21207
Modeling of carrier mobility against carrier concentration in arsenic-, phosphorus-, and boron-doped silicon
resolves10.1109/TED.2023.3245571
Analytical Physics-Based Modeling of Electron Channel Density in Nanosheet and Nanowire Transistors
resolves10.1109/TED.2022.3181575
Design Insights of Nanosheet FET and CMOS Circuit Applications at 5-nm Technology Node
resolves10.1109/TED.2022.3182300
Leakage Optimization of the Buried Oxide Substrate of Nanosheet Field-Effect Transistors
resolves10.1109/TDMR.2022.3181672
Design Optimization of Three-Stacked Nanosheet FET From Self-Heating Effects Perspective
resolves10.1109/ACCESS.2024.3392621
Spacer Dielectric Analysis of Multi-Channel Nanosheet FET for Nanoscale Applications
resolves10.1038/s41598-024-58081-z
Core-insulator embedded nanosheet field-effect transistor for suppressing device-to-device variations
The 5 references without a DOI — listed, not checked
no DOI — not checkedIRDS 2022 Roadmap
no DOI — not checkedDetermination of ultra-thin gate oxide thicknesses for CMOS structures using quantum effects
no DOI — not checkedAnalytical model for parasitic resistance of N-stack forksheet FETs using modified transmission line method
no DOI — not checkedAtlas User Manual: Device Simulation Software
no DOI — not checkedStacked nanosheet gate-all-around transistor to enable scaling beyond FinFET
What this badge says. CiteStamped means the CHECKABLE references of this
work were clean at the dated check: each resolved to a known work in a public registry, and none
carried a retraction notice at that time. It says nothing about the quality, findings,
or importance of the work itself, and nothing about references deposited without a DOI.
checked 2026-07-23 — re-checked daily as this page is visited; titles and statuses come from Crossref and DataCite and are not part of the signed record
Embed this badge
Both snippets point at the live badge image and link back to this page. The badge re-renders from the daily check, so an embed never goes stale by more than a day of visits.
<a href="https://citestamp.com/citestamped/10.1109/ted.2024.3465452"><img src="https://citestamp.com/citestamped/10.1109/ted.2024.3465452/badge.svg" alt="CiteStamped reference-health badge" width="460" height="64"></a>
[](https://citestamp.com/citestamped/10.1109/ted.2024.3465452)