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Reliability Evaluation of Grid-Connected Photovoltaic Power Systems

https://doi.org/10.1109/tste.2012.2186644
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17/17 checkable references clean · checked 2026-07-25

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

10 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 17 checked references that resolve
resolves10.1109/COMPEL.2010.5562393
Integrating photovoltaic inverter reliability into energy yield estimation with Markov models
resolves10.1109/PVSC.2009.5411343
Reliability and availability analysis of a fielded photovoltaic system
resolves10.1109/TR.2004.824831
Assessing the Reliability and Degradation of Photovoltaic Module Performance Parameters
resolves10.1109/TPEL.2007.909236
Reliability Prediction for Inverters in Hybrid Electrical Vehicles
resolves10.1109/TIE.2007.894732
Topology Study of Photovoltaic Interface for Maximum Power Point Tracking
resolves10.1002/0471707724
Risk Assessment of Power Systems
resolves10.1109/APEC.1995.469105
A simple tool for the selection of IGBTs for motor drives and UPSs
resolves10.1109/TPEL.2004.830089
A thermal model for insulated gate bipolar transistor module
resolves10.1109/TPWRS.2002.800989
Incorporating aging failures in power system reliability evaluation
resolves10.1109/24.488908
Tutorial: temperature as an input to microelectronics-reliability models
resolves10.1002/pip.825
Photovoltaic module reliability model based on field degradation studies
resolves10.1109/TIE.2006.878327
Intelligent PV Module for Grid-Connected PV Systems
resolves10.1109/TIE.2011.2114313
Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling
resolves10.1109/TIE.2008.924016
Reliability Issues in Photovoltaic Power Processing Systems
resolves10.1109/TIE.2008.924017
Development of a Methodology for Improving Photovoltaic Inverter Reliability
resolves10.1109/TR.1982.5221344
A Methodology for Photovoltaic System Reliability & Economic Analysis
resolves10.1109/TIM.2010.2102392
Toward a BITE for Real-Time Life Estimation of Capacitors Subjected to Thermal Stress
The 10 references without a DOI — listed, not checked
no DOI — not checkedImpact of inverter configuration on PV system reliability and energy production
no DOI — not checkedref19
no DOI — not checkedReliability consideration of low-power grid-tied inverter for photovoltaic application
no DOI — not checkedref1
no DOI — not checkedref20
no DOI — not checkedDeriving life multipliers for electrolytic capacitors
no DOI — not checkedref21
no DOI — not checkedref24
no DOI — not checkedref26
no DOI — not checkedref25
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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