Reference health
Molecular Rulers for Scaling Down Nanostructures
17/17 checkable references clean · checked 2026-07-23
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
6 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 17 checked references that resolve
resolves10.1117/3.2265070
Handbook of Microlithography, Micromachining, and Microfabrication. Volume 1: Microlithography
resolves10.1021/ja971027u
Nanoscopic Surface Architecture Based on Scanning Probe Electrochemistry and Molecular Self-Assembly
resolves10.1063/1.124461
Placement of conjugated oligomers in an alkanethiol matrix by scanned probe microscope lithography
resolves10.1126/science.286.5439.523
Multiple Ink Nanolithography: Toward a Multiple-Pen Nano-Plotter
resolves10.1126/science.277.5334.1971
Nanobeam Mechanics: Elasticity, Strength, and Toughness of Nanorods and Nanotubes
resolves10.1002/(SICI)1521-4095(199908)11:12<1021::AID-ADMA1021>3.0.CO;2-S
Orthogonal Self-Assembly on Colloidal Gold-Platinum Nanorods
resolves10.1116/1.585952
Engineering sub-50 nm quantum effect devices and single-electron transistors using electron-beam lithography
resolves10.1002/(SICI)1521-4095(199812)10:18<1515::AID-ADMA1515>3.0.CO;2-E
Engineering the Microfabrication of Layer-by-Layer Thin Films
resolves10.1021/ja00015a053
Self-assembled multilayers of .omega.-mercaptoalkanoic acids: selective ionic interactions
resolves10.1116/1.585504
Room temperature surface diffusion mechanisms observed by scanning tunneling microscopy
The 6 references without a DOI — listed, not checked
no DOI — not checkedThe XPS data are available as Web tables 1 and 2 and Web fig. 1 available at Science Online www.sciencemag.org/cgi/content/full/291/5506/1019/DC1.
no DOI — not checkedT. van der Boom-Moav personal communication.
no DOI — not checkedAs shown in the bottom row of Table 1 the gap in this 20-layer sample is smaller than expected (∼32 nm instead of an expected ∼40 nm). This difference might be due to changes in packing of the layers after several adsorptions or to a tilt of the structure.
no DOI — not checkedA. Hatzor P. S. Weiss in preparation.
no DOI — not checkedIn some samples after the lift-off process the gap was wider than expected from the multilayer borderline. This phenomenon might be the result of annealing of the newly formed metal wire into a more stable thinner form caused by the lift-off process. These samples were excluded from the calculation.
no DOI — not checkedWe thank E. Basgall T. Kuzma J. Lonjin and A. Mieckowski for technical assistance and R. Hengstebeck for XPS measurements. We also thank T. Mallouk and R. Davis for helpful discussions and D. Allara for the use of his ellipsometer. Supported by the Army Research Office the Defense Advanced Research Projects Agency the National Science Foundation and the Office of Naval Research.
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