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XPS Analysis of AuGeNi/Cleaved GaAs(110) Interface

https://doi.org/10.1155/2016/7574526

17/17 checkable references clean · checked 2026-07-23

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

2 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 17 checked references that resolve

resolves10.1016/s0040-6090(97)00439-2

A survey of ohmic contacts to III-V compound semiconductors

resolves10.1016/S1468-6996(01)00150-4

Development of refractory ohmic contact materials for gallium arsenide compound semiconductors

resolves10.1088/0268-1242/23/2/025019

Ohmic contacts to pseudomorphic HEMTs with low contact resistance due to enhanced Ge penetration through AlGaAs layers

resolves10.1016/0040-6090(87)90283-5

In situ X-ray diffraction study of the effects of germanium and nickel concentrations on melting in gold-based contacts to gallium arsenide

resolves10.1063/1.332011

Electron microscope studies of an alloyed Au/Ni/Au-Ge ohmic contact to GaAs

resolves10.1016/0169-4332(93)90241-3

Characterisation of TiN coatings and of the TiN/Si interface by X-ray photoelectron spectroscopy and Auger electron spectroscopy

resolves10.1016/0021-9517(79)90237-9

The extent of charge localization on oxygen ions and catalytic activity on solid state oxides in allylic oxidation of propylene

resolves10.1116/1.571450

An XPS study of the oxidation of AlAs thin films grown by MBE

resolves10.1016/0169-4332(91)90063-p

XPS valence band studies of the bonding chemistry of germanium oxides and related systems

resolves10.1016/0022-3093(93)90170-3

Core level binding energy shifts in liquid binary alloys: AuGa

resolves10.1016/j.jcrysgro.2007.11.001

Angle-resolved XPS structural investigation of GaAs surfaces

resolves10.1016/0040-6090(78)90341-3

Behaviour of gold in the vicinity of the interface during annealing

resolves10.1016/0040-6090(87)90436-6

Structure of GaAs-In0.2Ga0.8As heterojunction interface studied by electron spectroscopies: X-ray photoelectron spectroscopy, tunable electron energy loss spectroscopy and Auger electron spectroscopy

resolves10.1063/1.2743729

X-ray photoelectron spectroscopic study of the formation of catalytic gold nanoparticles on ultraviolet-ozone oxidized GaAs(100) substrates

resolves10.1016/0368-2048(74)85015-2

ESCA study of molecular GeS3-x Tex As2 glasses

resolves10.1021/j100505a006

An ESCA study of the termination of the passivation of elemental metals

resolves10.1116/1.577913

Core level x-ray photoelectron spectroscopy of Au<i>x</i>Ga<i>y</i> alloys

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no DOI — not checked13

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