Reference health
KSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements
29/29 checkable references clean · checked 2026-07-22
Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.
10 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.
The 29 checked references that resolve
resolves10.1016/0040-6090(93)90331-I
Analysis of the oxidation of polycrystalline zinc selenide by spectroscopic ellipsometry and photothermal deflection spectroscopy
resolves10.1016/0040-6090(94)90009-4
Characterization of TiNxOy thin films on architectural glass by X-ray reflection and spectrophotometry
resolves10.1016/S0168-9002(96)01016-9
Ordinary and extraordinary complex refractive index of the lead tungstate (PbWO4) crystal
resolves10.1016/S0168-9002(01)00678-7
Study of some optical glues for the Compact Muon Solenoid at the large hadron collider of CERN
resolves10.1016/S0168-9002(00)01303-6
Investigation of the avalanche photodiodes for the CMS electromagnetic calorimeter operated at high gain
resolves10.1016/j.solener.2013.03.014
Approximated method for modelling hemispherical reflectance and evaluating near-specular reflectance of CSP mirrors
resolves10.1016/S0927-0248(01)00091-5
Hybrid equivalent model algorithm for the prediction of glazing angular properties
resolves10.1016/j.jnoncrysol.2008.11.040
Optical reflectance and transmittance of a multilayer coating affected by refractive-index inhomogeneity, interface roughness, and thickness wedge
resolves10.1088/0963-9659/4/1/003
Thickness and model optimization in characterization of optical interference films by using discontinuities of n(lambda) solutions
resolves10.1088/0963-9659/4/6/012
Characterization of inhomogeneous optical interference films using a complex parabolic profile model
resolves10.1016/0165-1633(82)90065-X
Optical absorption above the optical gap of amorphous silicon hydride
resolves10.1016/S0022-3093(97)00203-2
Characterisation of SnO films on architectural glass by neutron reflectometry, SIMS, CEMS and spectrophotometry
resolves10.1016/S0040-6090(99)00212-6
Characterisation of antireflective TiO 2 //SiO 2 coatings by complementary techniques
resolves10.1016/j.tsf.2009.09.044
High mobility transparent conducting oxides for thin film solar cells
resolves10.1002/aenm.201801692
Inorganic Materials as Hole Selective Contacts and Intermediate Tunnel Junction Layer for Monolithic Perovskite‐CIGSe Tandem Solar Cells
resolves10.1021/j100393a010
Detailed photocurrent spectroscopy of the semiconducting group VIB transition metal dichalcogenides
resolves10.1080/00018736900101307
The transition metal dichalcogenides discussion and interpretation of the observed optical, electrical and structural properties
resolves10.1016/j.solener.2019.08.029
Fabrication of monolithic CZTS/Si tandem cells by development of the intermediate connection
The 10 references without a DOI — listed, not checked
no DOI — not checkedmmonty1960/ksemaw: v0.9.6 (Version ksemaw).
no DOI — not checkedPrinciples of Optics
no DOI — not checkedQuantum Electronics
no DOI — not checkedFundamentals of Semiconductors
no DOI — not checkedConcentrating solar power projects
no DOI — not checkedSpectrophotometric characterization of homogeneous and inhomogeneous thin films for architectural glazing applications.
no DOI — not checkedNeutron reflectometry for the invesgation of multilayer coatings for building applications.
no DOI — not checkedParameters and Method to Evaluate the Reflectance Properties of Reflector Materials for Concentrating So-lar Power Technology, V 3.1
no DOI — not checkedHandbook of Optical Constants of Solids
no DOI — not checkedIndustrial TCOs for SHJ solar cells: Approaches for optimizing performance and cost.
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