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Stress and adhesion of chromia-rich scales on ferritic stainless steels in relation with spallation

https://doi.org/10.1590/s1516-14392004000100012
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14/14 checkable references clean · checked 2026-07-23

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

6 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 14 checked references that resolve
resolves10.1002/jrs.734
<i>In situ</i> Raman monitoring of chromium oxide scale growth for stress determination
resolves10.1016/0010-938X(92)90014-T
Ex situ and in situ determination of stress distributions in chromium oxide films by raman microscopy
resolves10.1016/S0022-3697(00)00215-8
High-pressure study of Cr2O3 obtained by high-temperature oxidation by X-ray diffraction and Raman spectroscopy
resolves10.1007/BF02153461
Strain determination in thermally-grown alumina scales using fluorescence spectroscopy
resolves10.1007/BF01046985
Measurement of the stress in oxide scales formed by oxidation of alumina-forming alloys
resolves10.1007/BF00455603
The use of the “inverted-blister test” to measure the adhesion of an electrocoated paint layer adhering to a steel substrate
resolves10.1179/026708302225006098
Inverted blister test to measure adhesion energy of thermal oxide scales on metals or alloys
resolves10.1016/S1359-6462(98)00079-7
Oxide Scale Stress Determination by Raman Spectroscopy Application to the NiCr/Cr2O3 System and Influence of Yttrium
resolves10.4028/www.scientific.net/MSF.251-254.333
Determination of Stress Gradients in a Thermally Grown Oxide Layer Using X-Ray Diffraction
resolves10.1023/A:1018822222663
Modeling of Residual Stress in Oxide Scales
resolves10.1016/S1359-6454(97)00306-6
Determination of the growth stress and strain in α-Al2O3 scales during the oxidation of Fe–22Cr–4.8Al–0.3Y alloy
resolves10.1080/09603409.1994.11689481
Stresses generated during oxidation sequences and high temperature fracture
resolves10.1016/0921-5093(94)09747-X
Stresses in NiO, Cr2O3 and Al2O3 oxide scales
resolves10.1016/S1359-6454(00)00053-7
The ratcheting of compressed thermally grown thin films on ductile substrates
The 6 references without a DOI — listed, not checked
no DOI — not checkedAdvantages of ferritic stainless steels in cyclic high temperature conditions
no DOI — not checkedref5
no DOI — not checkedref6
no DOI — not checkedApplication of the blister test to adhesion energy measurements in metal-ceramic film-on-substrate systems
no DOI — not checkedref16
no DOI — not checkedref19
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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