Reference health

Novel Paradigm in Afm Probe Fabrication: Broadened Range of Stiffness, Materials, and Tip Shapes

https://doi.org/10.2139/ssrn.4111238
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22/22 checkable references clean · checked 2026-07-22

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

10 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 22 checked references that resolve
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Atomic Force Microscope
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Effect of progressive wear on the friction characteristics of nickel LIGA processed rotors
resolves10.1016/j.actamat.2008.04.052
Thermally-treated Pt-coated silicon AFM tips for wear resistance in ferroelectric data storage
resolves10.1109/TMAG.2008.2002866
Fabrication of Magnetic Force Microscopy Tips via Electrodeposition and Focused Ion Beam Milling
resolves10.1063/1.1791321
Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
resolves10.1039/C8NR02225A
Silver nanowires for highly reproducible cantilever based AFM-TERS microscopy: towards a universal TERS probe
resolves10.1016/j.ultramic.2011.02.001
Optimized hand fabricated AFM probes for simultaneous topographical and electrochemical tapping mode imaging
resolves10.1016/j.mechatronics.2016.05.015
Mechanical properties and applications of custom-built gold AFM cantilevers
resolves10.1088/0960-1317/14/2/006
A mould-and-transfer technology for fabricating scanning probe microscopy probes
resolves10.1088/0957-4484/20/34/345703
All-metal AFM probes fabricated from microstructurally tailored Cu–Hf thin films
resolves10.1515/ntrev-2018-0075
Simulation model for frictional contact of two elastic surfaces in micro/nanoscale and its validation
resolves10.1016/j.ultramic.2017.06.012
Method for lateral force calibration in atomic force microscope using MEMS microforce sensor
resolves10.1016/j.wear.2005.01.033
The effect of contact area on nano/micro-scale friction
resolves10.1063/1.4962866
A virtual instrument to standardise the calibration of atomic force microscope cantilevers
resolves10.1016/S0043-1648(03)00304-1
High load AFM friction and wear experiments on V2O5 thin films
resolves10.1016/S1359-6454(98)00062-7
Micro/nanoscale friction and wear mechanisms of thin films using atomic force and friction force microscopy
resolves10.1007/s11249-007-9263-4
Friction Study of a Ni Nanodot-patterned Surface
resolves10.1007/s11249-009-9483-x
Evaluation of Friction Behavior and Its Contact-Area Dependence at the Micro- and Nano-Scales
resolves10.1002/sca.1996.4950180508
Magnetic refinement of tips for magnetic force microscopy
resolves10.1007/s00161-021-00999-0
Friction coefficient of solid lubricating coating as a function of contact pressure: experimental results and microscale modeling
resolves10.1016/j.jmps.2016.01.012
Sliding friction across the scales: Thermomechanical interactions and dissipation partitioning
resolves10.1088/0957-4484/15/11/033
Scale dependence of micro/nano-friction and adhesion of MEMS/NEMS materials, coatings and lubricants
The 10 references without a DOI — listed, not checked
no DOI — not checkedref3
no DOI — not checkedTriboelectric Nanogenerator: A Foundation of the Energy for the New Era
no DOI — not checkedDevelopment of a metal-tip cantilever for noncontact atomic force microscopy
no DOI — not checkedAFM cantilevers with spherical tip of millimeter size
no DOI — not checkedFabrication of an all-metal atomic force microscope probe
no DOI — not checkedRobust microscale superlubricity under high contact pressure enabled by graphene-coated microsphere
no DOI — not checkedref26
no DOI — not checkedref27
no DOI — not checkedref31
no DOI — not checkedref32
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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