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Measurement and Controlling Friction Force in a Sliding Microwire by Size and Boundary Condition Variation

https://doi.org/10.2139/ssrn.4861933
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13/13 checkable references clean · checked 2026-07-22

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

13 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 13 checked references that resolve
resolves10.1007/s00542-011-1232-z
Modeling and finite element analysis of mechanical behavior of flexible MEMS components
resolves10.1007/978-0-387-78701-5
Micro and Nano Mechanical Testing of Materials and Devices
resolves10.1063/1.2058178
Reducing the effects of adhesion and friction in microelectromechanical systems (MEMSs) through surface roughening: Comparison between theory and experiments
resolves10.1557/mrs2001.65
Tribology of MEMS
resolves10.1007/s12206-022-0825-z
Mechanical and dynamic characteristics of double and single beam cantilevers for MEMS manipulation
resolves10.1163/15685610360554384
Adhesion and friction forces in microelectromechanical systems: mechanisms, measurement, surface modification techniques, and adhesion theory
resolves10.1016/j.ijsolstr.2004.10.001
Size-scale effects on the friction coefficient
resolves10.1201/9781420060089
Surfactants in Tribology, Volume 1
resolves10.1163/016942410X508226
Microscale Friction Reduction by Normal Force Modulation in MEMS
resolves10.1038/s41598-018-23150-7
Contact geometry and mechanics predict friction forces during tactile surface exploration
resolves10.1016/j.sna.2011.05.020
Precision friction measurement between ultrathin wire and microprobe
resolves10.1038/s41598-021-87484-5
Dynamically induced friction reduction in micro-structured interfaces
resolves10.15282/jmes.14.4.2020.12.0586
Numerical analysis of reaction forces at the supports of sliding microwire
The 13 references without a DOI — listed, not checked
no DOI — not checkedMinimizing Surface Driving and Disturbance Forces in MEMS's Microstructure-A Review
no DOI — not checkedModeling the effect of surface roughness on the adhesion, contact and friction in Micro-Electro-Mechanical System (MEMS) interfaces
no DOI — not checkedref4
no DOI — not checkedref5
no DOI — not checkedQuantification of Electrostatic and Adhesive Forces Between Microwire and Microprobe Using Experimental and Numerical Approaches" (Arab
no DOI — not checkedOn MEMS reliability and failure mechanisms
no DOI — not checkedControlling high-speed dry friction through the geometry of micro-patterned asperities
no DOI — not checkedStudy on Performance of Micro-friction and Its Control in MEMS
no DOI — not checkedref21
no DOI — not checkedSolutions for friction reduction at nano/microscale for MEMS actuators-based devices
no DOI — not checkedModeling and simulating MEMS devices using finite element analysis
no DOI — not checkedref25
no DOI — not checkedref26
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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