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Contactless electroreflectance spectroscopy of optical transitions in low dimensional semiconductor structures

https://doi.org/10.2478/s11772-012-0022-1
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33/33 checkable references clean · checked 2026-07-22

Every reference with a DOI in the deposited reference list resolved to a known work in Crossref or DataCite at the dated check, and none carried a retraction, withdrawal, or removal notice.

17 without a DOI — not checked. A reference deposited without a DOI is never matched by title or guessed at; it stays outside the checked set, and this line discloses that.

The 33 checked references that resolve
resolves10.1134/S1063782606120116
Optical reflection and contactless electroreflection from GaAlAs layers with periodically arranged GaAs quantum wells
resolves10.1088/0953-8984/16/31/006
Photoreflectance investigations of the energy level structure in GaInNAs-based quantum wells
resolves10.1016/0039-6028(73)90337-3
Third-derivative modulation spectroscopy with low-field electroreflectance
resolves10.1063/1.3462299
Contactless electroreflectance study of band bending in Be-doped GaInNAs/GaAs quantum wells: The origin of photoluminescence enhancement
resolves10.1063/1.1609651
Temperature dependent contactless electroreflectance study of intersubband transitions in a self-assembled InAs/InP (001) quantum dot structure
resolves10.1063/1.346176
Correlation of interference effects in photoreflectance spectra with GaAs homolayer thickness
resolves10.1063/1.2437729
Fermi level shift in GaInNAsSb∕GaAs quantum wells upon annealing studied by contactless electroreflectance
resolves10.1063/1.2743382
Contactless electroreflectance investigation of energy levels in a 1.3μm emitting laser structure with the gain medium composed of InAsN quantum dots embedded in GaInNAs∕GaAs quantum wells
resolves10.1063/1.119160
Contactless electroreflectance study of a vertically coupled quantum dot-based InAs/GaAs laser structure
resolves10.1103/PhysRevB.7.4605
Schottky-Barrier Electroreflectance: Application to GaAs
resolves10.1063/1.3213613
Photoreflectance and contactless electroreflectance measurements of semiconductor structures by using bright and dark configurations
resolves10.1063/1.1556176
Effect of InAs quantum dots on the Fermi level pinning of undoped-n+ type GaAs surface studied by contactless electroreflectance
resolves10.1063/1.1737065
Photoreflectance investigations of oscillator strength and broadening of optical transitions for GaAsSb–GaInAs/GaAs bilayer quantum wells
resolves10.1103/PhysRevLett.82.1221
Band Anticrossing in GaInNAs Alloys
resolves10.1063/1.1368156
Band parameters for III–V compound semiconductors and their alloys
resolves10.1063/1.2355551
On the modulation mechanisms in photoreflectance of an ensemble of self-assembled InAs∕GaAs quantum dots
resolves10.1063/1.368288
Characterization of a graded index of refraction separate confinement heterostructure (GRINSCH) laser structure using contactless electroreflectance
resolves10.1016/j.apsusc.2006.05.073
Photoreflectance spectroscopy of semiconductor structures at hydrostatic pressure: A comparison of GaInAs/GaAs and GaInNAs/GaAs single quantum wells
resolves10.1063/1.2817258
Contactless electroreflectance approach to study the Fermi level position in GaInNAs/GaAs quantum wells
resolves10.1063/1.1873052
Interference effects in electromodulation spectroscopy applied to GaAs-based structures: A comparison of photoreflectance and contactless electroreflectance
resolves10.1063/1.121759
Contactless electroreflectance characterization of GaInP/GaAs heterojunction bipolar transistor structures
resolves10.1063/1.3266011
Contactless electroreflectance of InGaN layers with indium content ≤36%: The surface band bending, band gap bowing, and Stokes shift issues
resolves10.1063/1.1774258
The energy-fine structure of GaInNAs∕GaAs multiple quantum wells grown at different temperatures and postgrown annealed
resolves10.1063/1.1628393
Contactless electroreflectance of CdSe/ZnSe quantum dots grown by molecular-beam epitaxy
resolves10.1063/1.1776312
Photoreflectance evidence of multiple band gaps in dilute GaInNAs layers lattice-matched to GaAs
resolves10.1063/1.106051
Novel contactless mode of electroreflectance
resolves10.1063/1.3125508
Photoreflectance study of exciton energies and linewidths for homoepitaxial and heteroepitaxial GaN layers
resolves10.1103/PhysRevB.10.4228
Band nonparabolicities, broadening, and internal field distributions: The spectroscopy of Franz-Keldysh oscillations
resolves10.1088/0268-1242/21/10/005
Room temperature contactless electroreflectance characterization of InGaAs/InAs/GaAs quantum dot wafers
resolves10.1063/1.3592801
The surface boundary conditions in GaN/AlGaN/GaN transistor heterostructures
resolves10.1063/1.3073718
Contactless electroreflectance of GaInNAsSb/GaNAs/GaAs quantum wells emitting at 1.5–1.65 μm: Broadening of the fundamental transition
resolves10.1116/1.589864
Features of InGaAlAs/InP heterostructures
resolves10.1063/1.2714686
The formation of self-assembled InAs∕GaAs quantum dots emitting at 1.3μm followed by photoreflectance spectroscopy
The 17 references without a DOI — listed, not checked
no DOI — not checkedIntrinsic limitations to the doping of wide gap semiconductors
no DOI — not checkedContactless electroreflectance and photo luminescence study of highly strained InGaAs double quantum wells a
no DOI — not checkedModulated reflectivity probing of quantum dot and wetting layer states in InAs InP quantum dot laser structures a
no DOI — not checkedPhotoreflectance spec troscopy of low dimensional semiconductor structures
no DOI — not checkedand Photoreflectance and contactless electrore flectance spectroscopy of GaAs based structures : The below band gap oscillation features
no DOI — not checkedand Photoreflectance spectroscopy of step like GaInNAs GaAs quantum wells a
no DOI — not checkedEvidence for Fermi level shift in GaInAs / GaAs quantum well upon nitrogen incorpo ration Solid State
no DOI — not checkedApplication of contactless electroreflectance to III nitrides
no DOI — not checkedApplication of contactless electroreflectance to study the epi readiness of m plane GaN substrates obtained by ammo nothermal method
no DOI — not checkedContactless electroreflectance characterization of three InGaAs quantum wells placed in a GaAs / AlGaAs resonant cavity Solid State
no DOI — not checkedOn the deep ness of contactless electroreflectance probing in semicon ductor structures a
no DOI — not checkedContactless electroreflectance studies of II VI nanostruc tures grown by molecular beam epitaxy
no DOI — not checkedPhotoreflectance spectroscopy of microstructures Semiconductors and Semi metals Vol edited by Academic Press New York
no DOI — not checkedModulation spectroscopy of semiconduc tor materials interfaces and microstructures : an overview San Diego
no DOI — not checkedOptically probed wetting layer in InAs InP quantum dash structures
no DOI — not checkedSemi conductor heterostructures and device structures investigated by photo reflectance spectroscopy
no DOI — not checkedPhoto modulated reflectance and transmittance : optical character ization of novel semiconductor materials and device struc tures Thin Solid
What this badge says. CiteStamped means the CHECKABLE references of this work were clean at the dated check: each resolved to a known work in a public registry, and none carried a retraction notice at that time. It says nothing about the quality, findings, or importance of the work itself, and nothing about references deposited without a DOI.

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