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Charge Trapping in Intergrain Regions of Pentacene Thin Film Transistors
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inferred cites → https://doi.org/10.1021/jp0653003 openalex-snapshot Microscopic Description of Elementary Growth Processes and Classification of Structural Defects in Pentacene Thin Films
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inferred cites → https://doi.org/10.1063/1.1637443 openalex-snapshot Surface potential profiling and contact resistance measurements on operating pentacene thin-film transistors by Kelvin probe force microscopy
inferred cites → https://doi.org/10.1103/physrevb.73.245310 openalex-snapshot Origin of the highest occupied band position in pentacene films from ultraviolet photoelectron spectroscopy: Hole stabilization versus band dispersion
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inferred ← cites https://doi.org/10.4236/jamp.2016.47125 openalex-snapshot Electrical Instability in Pentacene Transistors with Mylar and PMMA/Mylar Gate Dielectrics Transferred by Lamination Process
inferred ← cites https://doi.org/10.7567/jjap.53.030304 openalex-snapshot Influence of lithium fluoride thickness on electrical switching behavior in a cross-point structure using self-assembly molecules
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