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XPS investigation of anodic oxides grown on p‐type InP

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What this work says

Outgoing claims: the papers this work cites, builds on, or argues with.

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inferred← citeshttps://doi.org/10.1149/1.1566536openalex-snapshot

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inferred← citeshttps://doi.org/10.1149/1.2191008openalex-snapshot

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inferred← citeshttps://doi.org/10.1149/1.2906129openalex-snapshot

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inferred← citeshttps://doi.org/10.1149/2.016304jssopenalex-snapshot

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inferred← citeshttps://doi.org/10.1179/mht.2003.032openalex-snapshot

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inferred← citeshttps://doi.org/10.1209/0295-5075/109/28004openalex-snapshot

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inferred← citeshttps://doi.org/10.15407/mfint.39.11.1573openalex-snapshot

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inferred← citeshttps://doi.org/10.1557/proc-284-619openalex-snapshot

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inferred← citeshttps://doi.org/10.3390/ma14143810openalex-snapshot

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inferred← citeshttps://doi.org/10.3390/nano12030573openalex-snapshot

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inferred← citeshttps://doi.org/10.3390/nano12091458openalex-snapshot

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inferred← citeshttps://doi.org/10.3390/nano12193533openalex-snapshot

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inferred← citeshttps://doi.org/10.37394/232031.2026.5.3openalex-snapshot

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inferred← citeshttps://doi.org/10.70675/77f1f151z8fb7z4e7dza88dz27b9796edb00openalex-snapshot

Nanostructures d’oxyde d’indium pour les mémoires résistives RRAM intégrées en CMOS Back-End-Of-Line

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